Multi-scale analysis of well-logging data in petrophysical and stratigraphic correlation

Establishment of sequence limits in a stratigraphic column (i.e., related to depositional environments) represents in particular a great contribution to the analysis and characterization of oil reservoirs. In this context, we applied the continuous as well as the discrete wavelet transforms, to data...

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Published inGeofísica internacional Vol. 49; no. 2; pp. 55 - 67
Main Authors Coconi-Morales, E., Ronquillo-Jarillo, G., Campos-Enríquez, J. O.
Format Journal Article
LanguagePortuguese
Published Instituto de Geofísica, UNAM 01.06.2010
Subjects
Geochemistry & Geophysics
Transformada de ondícula
registros geofísicos de pozos
Wavelet transform
multiscale analysis
repetition patterns
patrones de repetición
ciclicidad
cyclicity
geophysical well logging
análisis multiescala
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Summary:Establishment of sequence limits in a stratigraphic column (i.e., related to depositional environments) represents in particular a great contribution to the analysis and characterization of oil reservoirs. In this context, we applied the continuous as well as the discrete wavelet transforms, to data from geophysical well logs from an oil producing area in the Gulf of Mexico, in order to bring about periodicities or cycles and correlate them with lithologic and stratigraphic characteristics of the associated environments. A multiscale analysis of geophysical well loggings (gamma ray, resistivity, and spontaneous potential) was done based in the wavelet transform. In particular the wavelet coeffcients were determined. Analysis of the obtained spectrograms-scalograms enabled to establish characteristic pseudowavelengths for each scale (frequencies). Pseudo wavelengths were associated with possible periodicities in deposition (Milankovitch's climatic cycles) of the study area. This case history shows that the wavelet analysis is a helpful complementary technique for reservoir characterization, specifcally in the location of stratigraphic sequences and associated facies.
ISSN:0016-7169