Enhanced X‑ray Imaging with Gd2O2S:Pr-Epoxy Composite Films: Synthesis, High-Resolution Performance, and Flexibility

• Published in: ACS applied electronic materials Vol. 6; no. 4; pp. 2782 - 2787
• Main Authors: Sun, Jinghan, Du, Yongxiao, Luo, Zhaohua, Guo, Hai, Liu, Yongfu, Sun, Peng, Jiang, Jun
• Format: Journal Article
• Language: English
• Published: American Chemical Society 23.04.2024
• Subjects: flexibility; composite scintillation film; Gd2O2S:Pr phosphor; X-ray imaging; high-resolution performance
• ISSN: 2637-6113; 2637-6113
• DOI: 10.1021/acsaelm.4c00384

Organic–inorganic composite scintillation films, recognized for their cost-efficiency and tunable scintillation characteristics, have been the subject of extensive research due to their considerable promise for use in X-ray flat panel imaging applications. This study presents a composite scintillation film utilizing Gd2O2S:Pr phosphors, traditional yet effective in this application. By optimizing the solid-state reaction process and employing acid pickling to eliminate impurities, we achieved Gd2O2S:Pr phosphors with pure phase and precise stoichiometric ratios. Subsequently, these phosphors were combined with epoxy resin to fabricate a composite scintillation film, which demonstrated excellent structural uniformity and flexibility. Furthermore, its imaging performance was evaluated under X-ray irradiation, revealing a resolution of 8 line pairs per millimeter. This outcome underscores the substantial promise of our films for advanced X-ray imaging applications, paving the way for future advancements in this domain.