Extraction of circuit models for substrate cross-talk
An increasingly urgent topic for the realization of densely packed (mixed signal) integrated circuits is prevention of cross-talk via the substrate. This paper proposes a Boundary Element Method (BEM) for calculating an admittance matrix for the substrate in order to analyze the parasitic coupling d...
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Published in | International Conference on Computer Aided Design: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design; 05-09 Nov. 1995 pp. 199 - 206 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
Washington, DC, USA
IEEE Computer Society
01.12.1995
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Series | ACM Conferences |
Subjects | |
Online Access | Get full text |
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Summary: | An increasingly urgent topic for the realization of densely packed (mixed signal) integrated circuits is prevention of cross-talk via the substrate. This paper proposes a Boundary Element Method (BEM) for calculating an admittance matrix for the substrate in order to analyze the parasitic coupling during layout verification.In contrast with standard BE methods, we propose a Green's function which is specific to the domain and the problem. This allows minimal discretization and a direct extraction of circuit models for the cross-talk. The extraction can be combined with an efficient model reduction technique to obtain more simple, yet accurate models for the cross-talk. The complete extraction process has a linear time complexity and a constant memory usage. The method is fully implemented and integrated in an existing layout-to-circuit extractor. |
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Bibliography: | SourceType-Conference Papers & Proceedings-1 ObjectType-Conference Paper-1 content type line 25 |
ISBN: | 9780818672132 0818672137 |
DOI: | 10.5555/224841.224881 |