Introduction to Scanning Tunneling Microscopy (3rd Edition)
The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and exp...
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| Main Author | |
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| Format | eBook |
| Language | English |
| Published |
Oxford
Oxford University Press
2021
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| Series | Monographs on the Physics and Chemistry of Materials |
| Subjects | |
| Online Access | Get full text |
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| Abstract | The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The Second Edition is a thoroughly updated version of this 'bible' in the field. The Second Edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. |
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| AbstractList | The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The Second Edition is a thoroughly updated version of this 'bible' in the field. The Second Edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to visualize and utilize the microscopic world around us. Since the publication of the first edition in 1993, this book has been recognized as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field. After an Overview chapter accessible for newcomers at an entry level presenting the basic design, scientific background, and illustrative applications, the book has three Parts. Part I, Principles, provides the most systematic and detailed theory of its scientific bases from basic quantum mechancis and condensed-metter physics in all available literature. Quantitative analysis of its imaging mechanism for atoms, molecules, and wavefunctions is detailed. Part II, Instrumentation, provides down to earth descriptions of its building components, including piezoelectric scanners, vibration isolation, electronics, software, probe tip preparation, etc. Part III, Related methods, presenting two of its most important siblings, scanning tunnelling specgroscopy and atomic force miscsoscopy. The book has five appendices for background topics, and 405 references for further readings. |
| Author | Chen C. Julian |
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| Copyright | 2021 |
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| DOI | 10.1093/oso/9780198856559.001.0001 |
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| Keywords | chemical bonds quantum mechanics tunnelling spectroscopy nanoscience scanning tunnelling microscope molecules surface physics atomic force microscope wavefunctions Nanotechnology atoms |
| Language | English |
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| Snippet | The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize... The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force... |
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| SubjectTerms | Condensed Matter Physics General Engineering & Project Administration General References |
| TableOfContents | Title Page
List of Figures
List of Tables
Prefaces
Table of Contents
1. Overview
Part I. Principles
2. Tunneling Phenomenon
3. Tunneling Matrix Elements
4. Atomic Forces
5. Atomic Forces and Tunneling
6. Nanometer-Scale Imaging
7. Atomic-Scale Imaging
8. Imaging Wavefunctions
9. Nanomechanical Effects
Part II. Instrumentation
10. Piezoelectric Scanner
11. Vibration Isolation
12. Electronics and Control
13. Mechanical Design
14. Tip Treatment
Part III. Related Methods
15. Scanning Tunneling Spectroscopy
16. Atomic Force Microscopy
Appendices
Bibliography
Index |
| Title | Introduction to Scanning Tunneling Microscopy (3rd Edition) |
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