Introduction to Scanning Tunneling Microscopy (3rd Edition)

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and exp...

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Bibliographic Details
Main Author Chen, C. Julian
Format eBook
LanguageEnglish
Published Oxford Oxford University Press 2021
SeriesMonographs on the Physics and Chemistry of Materials
Subjects
Condensed Matter Physics
General Engineering & Project Administration
General References
chemical bonds
quantum mechanics
tunnelling
spectroscopy
nanoscience
scanning tunnelling microscope
molecules
surface physics
atomic force microscope
wavefunctions
Nanotechnology
atoms
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Summary:The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The Second Edition is a thoroughly updated version of this 'bible' in the field. The Second Edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules.
ISBN:9780198856559
0198856555
DOI:10.1093/oso/9780198856559.001.0001