Automatic functional test program generation for microprocessors

• Published in: Annual ACM IEEE Design Automation Conference: Proceedings of the 25th ACM/IEEE conference on Design automation; 12-15 June 1988 pp. 605 - 608
• Main Authors: Lin, Chen-Shang, Ho, Hong-Fa
• Format: Conference Proceeding
• Language: English
• Published: Los Alamitos, CA, USA IEEE Computer Society Press 01.06.1988
• Series: ACM Conferences
• Subjects: Computer systems organization > Architectures; Computer systems organization > Dependable and fault-tolerant systems and networks; Computer systems organization > Embedded and cyber-physical systems; Computer systems organization > Real-time systems; General and reference > Cross-computing tools and techniques > Performance; Hardware > Robustness; Mathematics of computing > Mathematical software; Networks > Network performance evaluation
• ISBN: 0818688645; 9780818688645
• DOI: 10.5555/285730.285830

A new algorithm, O-algorithm, for automatic test program generation of microprocessors in a user environment is presented. Specifically, to eliminate the redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from Turing machine model. The O-algorithm is then constructed based on the signal flow model and functional fault models. The complexity of our algorithm is better than [6]. Moreover, the simulation had shown that the fault coverage is better than 97%.