Microbeam PIXE Analysis of Gold-Bearing Mineral Samples

Based on the proton induced X-ray emission (PIXE) technique, microbeam PIXE is a new technique of micro-analysis; its detection limit is 10 exp 2 times lower than that of an electron microprobe. It is very useful in trace element measurements of geological samples, and in microstructure studies of m...

Full description

Saved in:
Bibliographic Details
Published inChinese science bulletin Vol. 37; no. 5; pp. 375 - 378
Main Authors Ren, C-G, Zhou, S-J, Hu, W-M, Huang, F-Y, Tang, J Y, Yang, F-J, Wang, K R, Zhou, Y-Q
Format Journal Article
LanguageEnglish
Published 01.03.1992
Online AccessGet full text

Cover

More Information
Summary:Based on the proton induced X-ray emission (PIXE) technique, microbeam PIXE is a new technique of micro-analysis; its detection limit is 10 exp 2 times lower than that of an electron microprobe. It is very useful in trace element measurements of geological samples, and in microstructure studies of mineral compositions in the fields of mineralogy, mineragraphy and geochemistry. By using this technique, the characteristic spatial distribution of certain elements in a mineral sample can be measured so as to find out the combination status of the elements in the process of formation and evolution of a geological body or an ore deposit. The microbeam analysis of a mineral sample provides the first-hand information for industrial extraction and smelting. Iron, Ag, Au and Cu are determined in a Hishikari, Japan, mineral deposit.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1001-6538