Double-gate SOI devices for low-power and high-performance applications

Double-gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG devices, quasi-planar SOI FinFETs are easier to manufacture compared to planar double-gate devices. DG devices with independent...

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Published inInternational Conference on Computer Aided Design: Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design; 06-10 Nov. 2005 pp. 217 - 224
Main Authors Roy, K., Mahmoodi, H., Mukhopadhyay, S., Ananthan, H., Bansal, A., Cakici, T.
Format Conference Proceeding
LanguageEnglish
Published Washington, DC, USA IEEE Computer Society 31.05.2005
IEEE
ACM
SeriesACM Conferences
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Summary:Double-gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG devices, quasi-planar SOI FinFETs are easier to manufacture compared to planar double-gate devices. DG devices with independent gates (separate contacts to back and front gates) have recently been developed. DG devices with symmetric and asymmetric gates have also been demonstrated. Such device options have direct implications at the circuit level. Independent control of front and back gate in DG devices can be effectively used to improve performance and reduce power in sub-50nm circuits. Independent gate control can be used to merge parallel transistors in noncritical paths. This results in reduction in the effective switching capacitance and hence power dissipation. We show a variety of circuits in logic and memory that can benefit from independent gate operation of DG devices. As examples, we show the benefit of independent gate operation in circuits such as dynamic logic circuits, Schmitt triggers, sense amplifiers, and SRAM cells. In addition to independent gate option, we also investigate the usefulness of asymmetric devices and the impact of width quantization and process variations on circuit design.
Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:078039254X
9780780392540
DOI:10.5555/1129601.1129633