Value analysis tear-down a new process for product development and innovation

• Main Author: Sato, Yoshihiko
• Other Authors: Kaufman, J. Jerry
• Format: Electronic eBook
• Language: English
• Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
• Edition: 1st ed.
• Subjects: Value analysis (Cost control); Industrial productivity.; New products.; Engineering economy.; elektronické knihy; electronic books

"Value Analysis Tear-Down presents a new technology, first developed in Japan by Yoshihiko Sato, for improving existing products and creating new and better products. It combines traditional tear-down with the technologies of value analysis and value engineering." "This book is writte...