Atomic force microscopy in process engineering introduction to AFM for improved processes and products

• Other Authors: Bowen, W. Richard, Hilal, Nidal
• Format: Electronic eBook
• Language: English
• Published: Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009.
• Edition: 1st ed.
• Series: Butterworth-Heinemann/IChemE series.
• Subjects: Atomic force microscopy.; Production engineering.; elektronické knihy; electronic books

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...