Atomic force microscopy : exploring basic modes and advanced applications

• Main Author: Haugstad, Greg, 1963- (Author)
• Corporate Author: John Wiley & Sons
• Format: Electronic eBook
• Language: English
• Published: Hoboken. : Wiley, [2012]
• Subjects: mikroskopie atomárních sil; atomic force microscopy; monografie; elektronické knihy; monographs; electronic books