Lab VIEW run four point probe device : electrical characterization of semiconducting thin films made easy by four point probe system controlled by LabVIEW

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Bibliographic Details
Main Authors	Agumba, John (Author), Karimi, Patrick (Author), Okumu, John (Author)
Format	Book
Language	English
Published	Saarbrücken : LAP LAMBERT Academic Publishing, c2012
Subjects	fyzika tenkých vrstev tenké vrstvy polovodiče elektrická vodivost elektrické vlastnosti materiálů zkoušení materiálů automatizované měřicí systémy physics of thin layers thin films semiconductors electric conductivity electric properties of materials material testing automated measuring systems LabView studie studies

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Holdings details from Knihovna UTB
Status	More Information	Location	Call Number
Status CheckedOut – Due: 21.12.2024	More Information	Location FT	Call Number 53/AGUMBA,J.