Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

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Bibliographic Details
Main Authors Bushnell, Michael L. 1950- (Author), Agrawal, Vishwani D., 1943- (Author)
Format Book
LanguageEnglish
Published Boston : Kluwer, c2000
SeriesFrontiers in electronic testing
Subjects
testování elektronických systémů
VLSI
učebnice

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ikona Nápověda Glossary of Terms
Status More Information Location Call Number
Holdings details from Knihovna UTB
Status CheckedOut – Due: 22.12.2028 More Information Location FAI Call Number 621.38/BUSHNELL,M.L.

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