Electron Nano-Imaging : Basics of Imaging and Diffraction for TEM and STEM

In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main...

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Bibliographic Details
Main Author Tanaka, Nobuo (Author)
Corporate Author SpringerLink (Online service)
Format Electronic eBook
LanguageEnglish
Published Tokyo : Springer Japan : Imprint: Springer, 2017.
Subjects
Online AccessPlný text

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