High resolution wide angle tomographic probe

The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an "Einzel&qu...

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Bibliographic Details
Main Authors Bostel, Alain, Yavor, Mikhail, Renaud, Ludovic, Deconihout, Bernard
Format Patent
LanguageEnglish
Published 06.12.2011
Online AccessGet full text

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