Semiconductor integrated circuit

During a period of preparation for actual operation, a reference clock is supplied to both a comparison clock input portion and a feedback clock input portion of a phase comparator while a feedback loop of a PLL (phase-locked loop) is interrupted, and a delay of a reset signal within the phase compa...

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Main Author Sumita, Masaya
Format Patent
LanguageEnglish
Published 18.10.2011
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Abstract During a period of preparation for actual operation, a reference clock is supplied to both a comparison clock input portion and a feedback clock input portion of a phase comparator while a feedback loop of a PLL (phase-locked loop) is interrupted, and a delay of a reset signal within the phase comparator is adjusted so as to reduce a detection dead zone of phase differences in the phase comparator.
AbstractList During a period of preparation for actual operation, a reference clock is supplied to both a comparison clock input portion and a feedback clock input portion of a phase comparator while a feedback loop of a PLL (phase-locked loop) is interrupted, and a delay of a reset signal within the phase comparator is adjusted so as to reduce a detection dead zone of phase differences in the phase comparator.
Author Sumita, Masaya
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Machida (5457788) 19951000
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Volk et al. (4829258) 19890500
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Watanabe (2006/0156119) 20060700
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Snippet During a period of preparation for actual operation, a reference clock is supplied to both a comparison clock input portion and a feedback clock input portion...
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