Test method of a magnetic disk and magnectic disk tester
A test burst signal is overwritten from a write end position over a connecting region determined by positional deviation between a read head and a write head and a peripheral speed of a disk. Since, therefore, the overwritten signal portion is overlapped on the test burst signal written at a write s...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English |
Published |
19.04.2011
|
Online Access | Get full text |
Cover
Loading…
Abstract | A test burst signal is overwritten from a write end position over a connecting region determined by positional deviation between a read head and a write head and a peripheral speed of a disk. Since, therefore, the overwritten signal portion is overlapped on the test burst signal written at a write start point, it is possible to reduce a width of the connecting region to thereby reduce a test inhibit region. |
---|---|
AbstractList | A test burst signal is overwritten from a write end position over a connecting region determined by positional deviation between a read head and a write head and a peripheral speed of a disk. Since, therefore, the overwritten signal portion is overlapped on the test burst signal written at a write start point, it is possible to reduce a width of the connecting region to thereby reduce a test inhibit region. |
Author | Kato, Haruyoshi Shitara, Kenichi |
Author_xml | – sequence: 1 givenname: Kenichi surname: Shitara fullname: Shitara, Kenichi – sequence: 2 givenname: Haruyoshi surname: Kato fullname: Kato, Haruyoshi |
BookMark | eNrjYmDJy89L5WSwCEktLlHITS3JyE9RyE9TSFTITUzPSy3JTFZIySzOVkjMS4GIJMOFSoA6Uot4GFjTEnOKU3mhNDeDgptriLOHbmlxQWJJal5JcXx6USKIMjC3NLI0MjYyJkIJAI1_MFk |
ContentType | Patent |
CorporateAuthor | Hitachi High-Technologies Corporation |
CorporateAuthor_xml | – name: Hitachi High-Technologies Corporation |
DBID | EFH |
DatabaseName | USPTO Issued Patents |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EFH name: USPTO Issued Patents url: http://www.uspto.gov/patft/index.html sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
ExternalDocumentID | 07929232 |
GroupedDBID | EFH |
ID | FETCH-uspatents_grants_079292323 |
IEDL.DBID | EFH |
IngestDate | Sun Mar 05 22:34:38 EST 2023 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-uspatents_grants_079292323 |
OpenAccessLink | https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7929232 |
ParticipantIDs | uspatents_grants_07929232 |
PatentNumber | 7929232 |
PublicationCentury | 2000 |
PublicationDate | 20110419 |
PublicationDateYYYYMMDD | 2011-04-19 |
PublicationDate_xml | – month: 04 year: 2011 text: 20110419 day: 19 |
PublicationDecade | 2010 |
PublicationYear | 2011 |
References | Perez (7196513) 20070300 Sako et al. (5675586) 19971000 Chen et al. (6166536) 20001200 White et al. (7075748) 20060700 (2000-57501) 20000200 Ozaki et al. (5057950) 19911000 Fukuyama et al. (7271974) 20070900 Yamada (7725794) 20100500 Richter (6265868) 20010700 (2000-57502) 20000200 Ikeda et al. (6731446) 20040500 (10-275434) 19981000 Ogawa et al. (6317281) 20011100 Perez (7109701) 20060900 Ehrlich et al. (6519107) 20030200 Nozu (6696831) 20040200 |
References_xml | – year: 20100500 ident: 7725794 contributor: fullname: Yamada – year: 19911000 ident: 5057950 contributor: fullname: Ozaki et al. – year: 20070900 ident: 7271974 contributor: fullname: Fukuyama et al. – year: 20040200 ident: 6696831 contributor: fullname: Nozu – year: 19981000 ident: 10-275434 – year: 20030200 ident: 6519107 contributor: fullname: Ehrlich et al. – year: 20060700 ident: 7075748 contributor: fullname: White et al. – year: 20060900 ident: 7109701 contributor: fullname: Perez – year: 20000200 ident: 2000-57501 – year: 20000200 ident: 2000-57502 – year: 20010700 ident: 6265868 contributor: fullname: Richter – year: 20070300 ident: 7196513 contributor: fullname: Perez – year: 20001200 ident: 6166536 contributor: fullname: Chen et al. – year: 19971000 ident: 5675586 contributor: fullname: Sako et al. – year: 20011100 ident: 6317281 contributor: fullname: Ogawa et al. – year: 20040500 ident: 6731446 contributor: fullname: Ikeda et al. |
Score | 2.801672 |
Snippet | A test burst signal is overwritten from a write end position over a connecting region determined by positional deviation between a read head and a write head... |
SourceID | uspatents |
SourceType | Open Access Repository |
Title | Test method of a magnetic disk and magnectic disk tester |
URI | https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7929232 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fS8MwED7mENQnRcXpNvLga7Q_0jR9lpUiTPYwYW8jbVIRNR1rhv_-Lo0UX7bXC1yOhLv7Ltx9AXhM0xITl-I01lVKmagUlVokVOs0i1QWaBW4Aef5Gy_e2esqWQ2g6GdhftCN6AZtaZ927cY2XXMlhnd_8dSTPzuOQOPYB37NdyPVQtXPqBqxCgbjExG41r5ZXlzAGapAyGZs-y9p5JdwuuikVzDQ5hrEEgMw8T82k6YmkqARxs0QEvXZfhEs6b2k6kW2ozG4AZLPli8F7bdZf2xd-8o6-DMnvoUhlvH6DkjNEdrEZch5UjERZTLE8lBHLJGI2NBLRjA6qOb-yNoDnPt3TkbDbAxDu93pCSZKW067U9gDW2lyug |
link.rule.ids | 230,309,783,805,888,64375 |
linkProvider | USPTO |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8MwDLamgXicQIAYzxy4BvpI0_YMq8pr6mFIu1VpkyIEpNOaib-P06CKC1wdybESxf6c2F8AruK4wsAlOQ1VHVOW1JIKlURUqTgNZOop6dkG5-cZz1_YwyJajCAfemE-8RjRJdrSXa-7pWn74kp0727jqSN_thyB2rIPfOmPVshCNjeoGrEKOuMN-xRli_umWb4L26gEQZs23a-wke3BZtFL92Gk9AEkc3TBxP3ZTNqGCIJmaNtFSORb904wqXeSehCZnsjgEEg2nd_mdJimfF3ZApbS-zEoPIIxJvLqGEjDEdyElc95VLMkSIWPCaIKWCQQs-E5mcDkTzUn_4xdwlZxl5VP97PHU9hxl56M-ukZjM1qrc4xaprqol-QbysgdbY |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Test+method+of+a+magnetic+disk+and+magnectic+disk+tester&rft.inventor=Shitara%2C+Kenichi&rft.inventor=Kato%2C+Haruyoshi&rft.number=7929232&rft.date=2011-04-19&rft.externalDBID=n%2Fa&rft.externalDocID=07929232 |