System and method for testing an embedded system
A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which includes the embedded system to be tested, is connected to the host computer via a network based on the network file system protocol. The host co...
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Format | Patent |
Language | English |
Published |
23.11.2010
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Online Access | Get full text |
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Abstract | A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which includes the embedded system to be tested, is connected to the host computer via a network based on the network file system protocol. The host computers are further connected with a control server, and each of the host computers comprises a root file system. The control server is configured for providing an interface for a user to set test parameters, controlling each of the host computers to invoke a test program, thereby testing the embedded system according to the test parameters, and receiving test results of the embedded system from the host computer. A related testing method is also provided. |
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AbstractList | A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which includes the embedded system to be tested, is connected to the host computer via a network based on the network file system protocol. The host computers are further connected with a control server, and each of the host computers comprises a root file system. The control server is configured for providing an interface for a user to set test parameters, controlling each of the host computers to invoke a test program, thereby testing the embedded system according to the test parameters, and receiving test results of the embedded system from the host computer. A related testing method is also provided. |
Author | Tong, Mo-Ying Dong, Hua Zhao, Hong-Bo Hong, Xue-Wen Tang, Chiang-Chung |
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CorporateAuthor | Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd Hon Hai Precision Industry Co., Ltd |
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References | (10-2006-0066578) 20060600 Denniston (2007/0011522) 20070100 Williams et al. (2008/0128715) 20080600 (1967498) 20070500 (10-2006-0062939) 20060600 Andrade et al. (7152027) 20061200 Jackson et al. (7073094) 20060700 |
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Snippet | A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which... |
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Title | System and method for testing an embedded system |
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