System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers
The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements, such as microcantilevers, forming part of an array, by emitting a light beam towards the array and by receiving a reflected light beam on an optical position detector, whe...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
12.01.2010
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Online Access | Get full text |
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