System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers

The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements, such as microcantilevers, forming part of an array, by emitting a light beam towards the array and by receiving a reflected light beam on an optical position detector, whe...

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Bibliographic Details
Main Authors Lechuga Gomez, Laura M, Alvarez Sanchez, Mar, Tamayo de Miguel, Francisco Javier
Format Patent
LanguageEnglish
Published 12.01.2010
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