Mechanism for read-only memory built-in self-test

• Main Authors: Chhabra, Pawan, Thomas, Tessil
• Format: Patent
• Language: English
• Published: 06.01.2009

In one embodiment, a method for on-die read only memory (ROM) built-in self-test (BIST) is disclosed. The method comprises testing odd word line entries of a read-only memory (ROM) array by performing two passes through the ROM array to test each odd word line entry for static and delay faults, test...