System for testing DUT and tester for use therewith

A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin...

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Bibliographic Details
Main Authors Magliocco, Paul, Wakefield, Ray, Trudeau, Paul G
Format Patent
LanguageEnglish
Published 10.06.2008
Online AccessGet full text

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