System for testing DUT and tester for use therewith

A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin...

Full description

Saved in:
Bibliographic Details
Main Authors Magliocco, Paul, Wakefield, Ray, Trudeau, Paul G
Format Patent
LanguageEnglish
Published 10.06.2008
Online AccessGet full text

Cover

Abstract A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin electronics channels, an interface for interfacing with the device, and a computer for interfacing with a host computer in the test system. The testers can be fastened directly to one another or to a common frame. Preferably, the interface enables a single device board to simultaneously engage interfaces on multiple testers. More preferably, the interface extends from a top surface of the tester to engage the device board. Vents in top and front surfaces of an enclosure enables movement of air to cool components of the tester without interference from testers on either side or a back of the enclosure.
AbstractList A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin electronics channels, an interface for interfacing with the device, and a computer for interfacing with a host computer in the test system. The testers can be fastened directly to one another or to a common frame. Preferably, the interface enables a single device board to simultaneously engage interfaces on multiple testers. More preferably, the interface extends from a top surface of the tester to engage the device board. Vents in top and front surfaces of an enclosure enables movement of air to cool components of the tester without interference from testers on either side or a back of the enclosure.
Author Trudeau, Paul G
Magliocco, Paul
Wakefield, Ray
Author_xml – sequence: 1
  givenname: Paul
  surname: Magliocco
  fullname: Magliocco, Paul
– sequence: 2
  givenname: Ray
  surname: Wakefield
  fullname: Wakefield, Ray
– sequence: 3
  givenname: Paul G
  surname: Trudeau
  fullname: Trudeau, Paul G
BookMark eNrjYmDJy89L5WQwDq4sLknNVUjLL1IoSS0uycxLV3AJDVFIzEsB81OLwFKlxakKJRmpRanlmSUZPAysaYk5xam8UJqbQcHNNcTZQ7e0uCCxJDWvpDg-vSgRRBmYG1uYghARSgCbti69
ContentType Patent
CorporateAuthor Nextest Systems Corporation
CorporateAuthor_xml – name: Nextest Systems Corporation
DBID EFH
DatabaseName USPTO Issued Patents
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EFH
  name: USPTO Issued Patents
  url: http://www.uspto.gov/patft/index.html
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
ExternalDocumentID 07385385
GroupedDBID EFH
ID FETCH-uspatents_grants_073853853
IEDL.DBID EFH
IngestDate Sun Mar 05 22:32:53 EST 2023
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-uspatents_grants_073853853
OpenAccessLink https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7385385
ParticipantIDs uspatents_grants_07385385
PatentNumber 7385385
PublicationCentury 2000
PublicationDate 20080610
PublicationDateYYYYMMDD 2008-06-10
PublicationDate_xml – month: 06
  year: 2008
  text: 20080610
  day: 10
PublicationDecade 2000
PublicationYear 2008
References Organ et al. (6449741) 20020900
Harns (4460997) 19840700
Okayasu (6157200) 20001200
Ueda (5053698) 19911000
Botka (5550466) 19960800
Sakai (5650732) 19970700
Yamada et al. (5497079) 19960300
Hanners et al. (6040691) 20000300
Arkin et al. (5951705) 19990900
Fujimoto (5952842) 19990900
Melgaard et al. (4729246) 19880300
References_xml – year: 19911000
  ident: 5053698
  contributor:
    fullname: Ueda
– year: 19970700
  ident: 5650732
  contributor:
    fullname: Sakai
– year: 20000300
  ident: 6040691
  contributor:
    fullname: Hanners et al.
– year: 19960800
  ident: 5550466
  contributor:
    fullname: Botka
– year: 20020900
  ident: 6449741
  contributor:
    fullname: Organ et al.
– year: 19990900
  ident: 5951705
  contributor:
    fullname: Arkin et al.
– year: 19990900
  ident: 5952842
  contributor:
    fullname: Fujimoto
– year: 19840700
  ident: 4460997
  contributor:
    fullname: Harns
– year: 19880300
  ident: 4729246
  contributor:
    fullname: Melgaard et al.
– year: 19960300
  ident: 5497079
  contributor:
    fullname: Yamada et al.
– year: 20001200
  ident: 6157200
  contributor:
    fullname: Okayasu
Score 2.709813
Snippet A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different...
SourceID uspatents
SourceType Open Access Repository
Title System for testing DUT and tester for use therewith
URI https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7385385
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LSwMxEB7aIqgnRcX6Igev0dTsbrZn7bJ4kB5a6K1ks5NeNC27Wfz7nWSleFHIJRmYDAmZR_jyBeBR6ImQVhqeao08Ucbyymbh19QKbZ1rpesIkP3IymXyvkpXAygPb2G-6BjxHdnSPnXtzm8juJLce7_xvCd_DhyBLrAPfLvPra7ntX0OrCzUhjDMRfjJYFaUp3BMKihlc779FTSKMziax9FzGKC7ANmTgzPKEpkP3BZuw96WC0alfOxjE0VdiywkZRhuSC-BFbPFa8kPM6w3TUCurMWPJfIKRlTB4zUwNNbmSkszMSrRL3qqMFGpkdLmqZqKagzjP9Xc_CO7hZMevpCRN72DkW86vKcY6auHuAB7TxtzDg
link.rule.ids 230,308,780,802,885,64039
linkProvider USPTO
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LTwMhEJ7UaqyeNGra-uLgFaWyu2zP1s36SLOHNultw7LQi9JmH_HvO7Cm8aIJF5hkmECYB_n4ALhjcsK44YqGUmoaCGVoYSL3a2qhTRlLIUsPkJ1H6TJ4XYWrHqS7tzCfeIzoFm2p79t622w8uBLde7fxtCN_dhyB1rEPfNmPjSyz0jw4VhZse7AfBYz7FDJJj2GASjBps039K2wkJ3CQ-dFT6Gl7BryjByeYJ5LGsVvYNZktFwSLed_XlRe1tSYuLdPujvQcSPK8eErpboZ8XTnsSs5-bOEX0McaXg-BaGVMLCRXEyUC-SinQgciVJybOBRTVoxg9Kea8T-yWzjMZkn-_jJ_u4SjDssQoWu9gn5TtfoaA2ZT3Pi1-AYhR3YK
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=System+for+testing+DUT+and+tester+for+use+therewith&rft.inventor=Magliocco%2C+Paul&rft.inventor=Wakefield%2C+Ray&rft.inventor=Trudeau%2C+Paul+G&rft.number=7385385&rft.date=2008-06-10&rft.externalDBID=n%2Fa&rft.externalDocID=07385385