Apparatus for reducing power supply noise in an integrated circuit

A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for example, to state changes in the DUT. To limit variation (noise) in voltage at the power input terminal,...

Full description

Saved in:
Bibliographic Details
Main Authors Eldridge, Benjamin N, Miller, Charles A
Format Patent
LanguageEnglish
Published 11.03.2008
Online AccessGet full text

Cover

Loading…
Abstract A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for example, to state changes in the DUT. To limit variation (noise) in voltage at the power input terminal, a supplemental current is supplied to the power input terminal.
AbstractList A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for example, to state changes in the DUT. To limit variation (noise) in voltage at the power input terminal, a supplemental current is supplied to the power input terminal.
Author Eldridge, Benjamin N
Miller, Charles A
Author_xml – sequence: 1
  givenname: Benjamin N
  surname: Eldridge
  fullname: Eldridge, Benjamin N
– sequence: 2
  givenname: Charles A
  surname: Miller
  fullname: Miller, Charles A
BookMark eNqNi0sKwkAMQGehC393yAWEYitdqygewL0M07QESiYkE8TbO4IHcPPe5r11WHBmXIXzSSRqLG4wZgXFwRPxBJJfqGAuMr-BMxkCMUSuLDjVAQdIpMmpbMNyjLPh7udNgNv1cbnv3aR2XOxZh6-avu0OXXNs_0g-OcI06A
ContentType Patent
CorporateAuthor FormFactor, Inc
CorporateAuthor_xml – name: FormFactor, Inc
DBID EFH
DatabaseName USPTO Issued Patents
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EFH
  name: USPTO Issued Patents
  url: http://www.uspto.gov/patft/index.html
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
ExternalDocumentID 07342405
GroupedDBID EFH
ID FETCH-uspatents_grants_073424053
IEDL.DBID EFH
IngestDate Sun Mar 05 22:31:10 EST 2023
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-uspatents_grants_073424053
OpenAccessLink https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7342405
ParticipantIDs uspatents_grants_07342405
PatentNumber 7342405
PublicationCentury 2000
PublicationDate 20080311
PublicationDateYYYYMMDD 2008-03-11
PublicationDate_xml – month: 03
  year: 2008
  text: 20080311
  day: 11
PublicationDecade 2000
PublicationYear 2008
References (3234004) 19840300
Baker, Keith et al., "Plug-and-Play IDDQ Testing for Test Fixtures", IEEE Design & Test of Computers, vol. 12, No. 3, pp. 53-61, Sep. 21, 1995.
"Device Test Method Using Power Supply Current Signature Comparison", IBM Technical Disclosure Bulletin, vol. 34, No. 4A, pp. 253-255, Sep. 1991.
Jennion et al. (5721495) 19980200
Ardezzone et al. (4144536) 19790300
Jennion et al. (5652524) 19970700
Ehiro (5760599) 19980600
Adams et al. (5101149) 19920300
(893876) 19990100
Pun et al. (6087843) 20000700
Runas et al. (5592077) 19970100
Massie (5822166) 19981000
Luk (6055661) 20000400
Mammano et al. (5422562) 19950600
Nishimura et al. (5386189) 19950100
Koelling et al. (5502671) 19960300
References_xml – year: 19980200
  ident: 5721495
  contributor:
    fullname: Jennion et al.
– year: 19840300
  ident: 3234004
– year: 19970100
  ident: 5592077
  contributor:
    fullname: Runas et al.
– year: 19981000
  ident: 5822166
  contributor:
    fullname: Massie
– year: 20000400
  ident: 6055661
  contributor:
    fullname: Luk
– year: 19790300
  ident: 4144536
  contributor:
    fullname: Ardezzone et al.
– year: 19980600
  ident: 5760599
  contributor:
    fullname: Ehiro
– year: 19990100
  ident: 893876
– year: 19970700
  ident: 5652524
  contributor:
    fullname: Jennion et al.
– year: 19920300
  ident: 5101149
  contributor:
    fullname: Adams et al.
– year: 19950600
  ident: 5422562
  contributor:
    fullname: Mammano et al.
– year: 20000700
  ident: 6087843
  contributor:
    fullname: Pun et al.
– year: 19960300
  ident: 5502671
  contributor:
    fullname: Koelling et al.
– year: 19950100
  ident: 5386189
  contributor:
    fullname: Nishimura et al.
Score 2.7025309
Snippet A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal...
SourceID uspatents
SourceType Open Access Repository
Title Apparatus for reducing power supply noise in an integrated circuit
URI https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7342405
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8QwEB52F0E9KSquL-bgNdpHtmmvu2wpgrIHhb1JmmahoGlpWhb_vZNWihc9BZIwGRJmvgnMfANwT0bkCyFjRn4gYDzyCxZzJdguiWSQR0qIwhUKP79E2Rt_2i62E8jGWphPMiNWky72obN1W_XJleTeh4dnA_mz4wg0jn1gbz4qWWyK3aMIOYHTYgrT2HOpXes0O4ZDEkEhm2ntL9BIT-Bg08-ewkSbM1hSwOd4tjuLFChi4zhTCTewdn3K0Lruml9oqtJqLA1KgyOTQ4GqbFRXtueA6fp1lbHxwHfa4AbvR7HwAmb0odeXgDrRkouEYgkZcwJs6UmtXGsoLkUeBWoO8z_FXP2zdg1HQzZDyHz_BmZt0-lbgsw2v-vv4xvAL3ep
link.rule.ids 230,309,786,808,891,64394
linkProvider USPTO
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8QwEB7WVXycFBV3feXgNbpts017VbfU19KDwt6WNM1CwU1L0yL-eyftUrzoKZCEyZAw801g5huAGzQih3MRUPQDLmW-k9GASU5XoS_c1JecZ7ZQ-G3uxx_seTFdDCDua2HWaEa0RF3MbWPKumiTK9G9dw9PO_JnyxGoLfvAl_4sRJZkqzvuMQSn6RZsW4y1LPqzKD6APRSCQZuuzS_YiA5hJ2lnj2Cg9DHcY8hnmbYbQzBUJJVlTUXkIKXtVEaM7a_5TXSRG0VyTYQmPZdDRmReySavT4BEs_eHmPYHLnGDHSYb1bxTGOKXXp0BUaESjIcYTYiAIWSLiVDSNodigqe-K0cw-lPM-J-1a9hNHqPl69P85Rz2u9QGjzrOBQzrqlGXiJ91etVezQ_HFHqj
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Apparatus+for+reducing+power+supply+noise+in+an+integrated+circuit&rft.inventor=Eldridge%2C+Benjamin+N&rft.inventor=Miller%2C+Charles+A&rft.number=7342405&rft.date=2008-03-11&rft.externalDBID=n%2Fa&rft.externalDocID=07342405