Apparatus for reducing power supply noise in an integrated circuit
A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for example, to state changes in the DUT. To limit variation (noise) in voltage at the power input terminal,...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
11.03.2008
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Online Access | Get full text |
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Abstract | A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for example, to state changes in the DUT. To limit variation (noise) in voltage at the power input terminal, a supplemental current is supplied to the power input terminal. |
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AbstractList | A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for example, to state changes in the DUT. To limit variation (noise) in voltage at the power input terminal, a supplemental current is supplied to the power input terminal. |
Author | Eldridge, Benjamin N Miller, Charles A |
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References | (3234004) 19840300 Baker, Keith et al., "Plug-and-Play IDDQ Testing for Test Fixtures", IEEE Design & Test of Computers, vol. 12, No. 3, pp. 53-61, Sep. 21, 1995. "Device Test Method Using Power Supply Current Signature Comparison", IBM Technical Disclosure Bulletin, vol. 34, No. 4A, pp. 253-255, Sep. 1991. Jennion et al. (5721495) 19980200 Ardezzone et al. (4144536) 19790300 Jennion et al. (5652524) 19970700 Ehiro (5760599) 19980600 Adams et al. (5101149) 19920300 (893876) 19990100 Pun et al. (6087843) 20000700 Runas et al. (5592077) 19970100 Massie (5822166) 19981000 Luk (6055661) 20000400 Mammano et al. (5422562) 19950600 Nishimura et al. (5386189) 19950100 Koelling et al. (5502671) 19960300 |
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Snippet | A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal... |
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Title | Apparatus for reducing power supply noise in an integrated circuit |
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