System and method for temperature compensation of eddy current sensor waveform parameters
An embodiment of the invention generally pertains to a method of compensating for temperature variations in an eddy current sensor signal. The method may include the steps of receiving an initial signal from an eddy current sensor (ECS) in response to a conductive element passing the ECS and sensing...
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Format | Patent |
Language | English |
Published |
09.01.2007
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Abstract | An embodiment of the invention generally pertains to a method of compensating for temperature variations in an eddy current sensor signal. The method may include the steps of receiving an initial signal from an eddy current sensor (ECS) in response to a conductive element passing the ECS and sensing an ECS temperature and an ECS board temperature. The method may also include determining a subset of correction coefficients based on the ECS temperature and the ECS board temperature and determining a temperature correction factor from the subset of correction coefficients. The method may then compute a temperature corrected signal from the initial signal and the temperature correction factor. |
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AbstractList | An embodiment of the invention generally pertains to a method of compensating for temperature variations in an eddy current sensor signal. The method may include the steps of receiving an initial signal from an eddy current sensor (ECS) in response to a conductive element passing the ECS and sensing an ECS temperature and an ECS board temperature. The method may also include determining a subset of correction coefficients based on the ECS temperature and the ECS board temperature and determining a temperature correction factor from the subset of correction coefficients. The method may then compute a temperature corrected signal from the initial signal and the temperature correction factor. |
Author | Gieske, Richard T Browning, Douglas R Mishkevich, Victor G |
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References | Simpson et al. (5698977) 19971200 Goldfine et al. (2004/0066188) 20040400 Twerdochlib (4970670) 19901100 Naudet et al. (6629463) 20031000 Schlicker et al. (2004/0232911) 20041100 von Flotow (6785635) 20040800 Schlicker et al. (2003/0071615) 20030400 Imam et al. (5258923) 19931100 Brandli et al. (3936734) 19760200 Buser et al. (4460869) 19840700 Passarelli, Jr. (5808202) 19980900 Twerdochlib (6661222) 20031200 Hedengren et al. (5371462) 19941200 Seberger et al. (5502999) 19960400 Goldfine et al. (6657429) 20031200 Yamada et al. (4095469) 19780600 Huschelrath (4821204) 19890400 Flotow (2003/0060986) 20030300 Imdad (4408294) 19831000 Pross (2002/0019708) 20020200 Allen (5226731) 19930700 von Flotow (6594619) 20030700 Kee (4468968) 19840900 Prinz et al. (6692222) 20040200 Lowery (5596271) 19970100 Slates (6664782) 20031200 Hill et al. (5206816) 19930400 Martin, Jr. et al. (4173869) 19791100 Metala et al. (5140264) 19920800 Twerdochlib (6094989) 20000800 Twerdochlib (4987555) 19910100 Slates (6346807) 20020200 |
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