Method and system for debugging an electronic system

Techniques and systems for debugging an electronic system having instrumentation circuitry included therein are disclosed. The techniques and systems facilitate analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level. Although the hardware designs...

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Main Authors Beardslee, John Mark, Schubert, Nils Endric, Perry, Douglas L
Format Patent
LanguageEnglish
Published 04.07.2006
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Abstract Techniques and systems for debugging an electronic system having instrumentation circuitry included therein are disclosed. The techniques and systems facilitate analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level. Although the hardware designs (which were designed in HDL) have been fabricated in integrated circuit products with limited input/output pins, the invention enables the hardware designs within the integrated circuit products to be comprehensively analyzed, diagnosed, and debugged at the HDL level at speed. The ability to debug hardware designs at the HDL level facilitates correction or adjustment of the HDL description of the hardware designs.
AbstractList Techniques and systems for debugging an electronic system having instrumentation circuitry included therein are disclosed. The techniques and systems facilitate analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level. Although the hardware designs (which were designed in HDL) have been fabricated in integrated circuit products with limited input/output pins, the invention enables the hardware designs within the integrated circuit products to be comprehensively analyzed, diagnosed, and debugged at the HDL level at speed. The ability to debug hardware designs at the HDL level facilitates correction or adjustment of the HDL description of the hardware designs.
Author Schubert, Nils Endric
Perry, Douglas L
Beardslee, John Mark
Author_xml – sequence: 1
  givenname: John Mark
  surname: Beardslee
  fullname: Beardslee, John Mark
– sequence: 2
  givenname: Nils Endric
  surname: Schubert
  fullname: Schubert, Nils Endric
– sequence: 3
  givenname: Douglas L
  surname: Perry
  fullname: Perry, Douglas L
BookMark eNrjYmDJy89L5WQw8U0tychPUUjMS1EoriwuSc1VSMsvUkhJTSpNT8_MSwdKKKTmpCaXFOXnZSZDlfAwsKYl5hSn8kJpbgYFN9cQZw_d0uKCxJLUvJLi-PSiRBBlYG5gbmRhaGFMhBIA9nMvcQ
ContentType Patent
CorporateAuthor Synplicity, Inc
CorporateAuthor_xml – name: Synplicity, Inc
DBID EFH
DatabaseName USPTO Issued Patents
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EFH
  name: USPTO Issued Patents
  url: http://www.uspto.gov/patft/index.html
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
ExternalDocumentID 07072818
GroupedDBID EFH
ID FETCH-uspatents_grants_070728183
IEDL.DBID EFH
IngestDate Sun Mar 05 22:33:18 EST 2023
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-uspatents_grants_070728183
OpenAccessLink https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7072818
ParticipantIDs uspatents_grants_07072818
PatentNumber 7072818
PublicationCentury 2000
PublicationDate 20060704
PublicationDateYYYYMMDD 2006-07-04
PublicationDate_xml – month: 07
  year: 2006
  text: 20060704
  day: 04
PublicationDecade 2000
PublicationYear 2006
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Score 2.639844
Snippet Techniques and systems for debugging an electronic system having instrumentation circuitry included therein are disclosed. The techniques and systems...
SourceID uspatents
SourceType Open Access Repository
Title Method and system for debugging an electronic system
URI https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7072818
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8MwDLa2CQk4DQFiPKYcuAay1lvKGa2qkDbtANJuU1Inu0A3ra3293HaaXCBaxw5Vl5-yP4M8MhXxjmMrbSRshLReWkSo6SLPI21J01RKHCezSfZB74tx8sOZMdamC9-RnLLspRPdbmtNk1yJX_v7cHLFvw5YAQWAX1gX3xuDC3IP2ulA7BRF7qJCqld0zQ7h1NmwSZbUZW_lEbah5NFM3oBHVdcAs6aZs2CXXfR4icLNhgFOVuHqO-aCeKnKc1hyhWIdPr-msnjEqv1LqSurNRBlPgaeuzCuxsQI4M564g8yW2E5DHxMTsybJvokXlBogEM_mRz-w_tDs7akICWCu-hV-1q98BKsrLDZge-AYN_cxI
link.rule.ids 230,309,786,808,891,64396
linkProvider USPTO
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8MwDLbGQDxOIEBsvHLgGshaj5QzrCqPTT2AtFuVNMku0E1rK_7-nHYaXOAaR46VOPFD8WeAG1IZazHUXAdCc0TruIqU4DZwZiidkSbwBc7jyX3ygS_T4bQDyaYW5ouuEV-QLOVtXS6qefO5kp739uB5C_7sMQILjz7wXXzOlUmNu5NCemCjLdj2Ntbr-ihODmCPmJDTVlTlL7MRH8JO2oweQccWx4Djpl0zo-CdtQjKjFxGZqyufd53RgT205ZmPeUEWDx6f0z4ZolstvSfVzKxFiY8hS4F8fYM2EBhTlYij3IdoHEYuZBCGfJO5EA9oDE96P3Jpv8P7Rp206c4e3uevJ7DfpsfkFzgBXSrZW0vyWJW-qrZjBVVu3YO
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Method+and+system+for+debugging+an+electronic+system&rft.inventor=Beardslee%2C+John+Mark&rft.inventor=Schubert%2C+Nils+Endric&rft.inventor=Perry%2C+Douglas+L&rft.number=7072818&rft.date=2006-07-04&rft.externalDBID=n%2Fa&rft.externalDocID=07072818