Omnidirectional eddy current probe and inspection system

An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the...

Full description

Saved in:
Bibliographic Details
Main Authors Wang, Changting, Plotnikov, Yuri Alexeyevich, Nath, Shridhar Champaknath, McKnight, William Stewart, Gambrell, Gigi Olive
Format Patent
LanguageEnglish
Published 21.03.2006
Online AccessGet full text

Cover

Abstract An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
AbstractList An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
Author Plotnikov, Yuri Alexeyevich
Nath, Shridhar Champaknath
Gambrell, Gigi Olive
Wang, Changting
McKnight, William Stewart
Author_xml – sequence: 1
  givenname: Changting
  surname: Wang
  fullname: Wang, Changting
– sequence: 2
  givenname: Yuri Alexeyevich
  surname: Plotnikov
  fullname: Plotnikov, Yuri Alexeyevich
– sequence: 3
  givenname: Shridhar Champaknath
  surname: Nath
  fullname: Nath, Shridhar Champaknath
– sequence: 4
  givenname: William Stewart
  surname: McKnight
  fullname: McKnight, William Stewart
– sequence: 5
  givenname: Gigi Olive
  surname: Gambrell
  fullname: Gambrell, Gigi Olive
BookMark eNrjYmDJy89L5WSw8M_Ny0zJLEpNLsnMz0vMUUhNSalUSC4tKkrNK1EoKMpPSlVIzEtRyMwrLoCoUSiuLC5JzeVhYE1LzClO5YXS3AwKbq4hzh66pcUFiSVAzcXx6UWJIMrA3MDQ1MzSwJgIJQAZ8TF5
ContentType Patent
CorporateAuthor General Electric Company
CorporateAuthor_xml – name: General Electric Company
DBID EFH
DatabaseName USPTO Issued Patents
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EFH
  name: USPTO Issued Patents
  url: http://www.uspto.gov/patft/index.html
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
ExternalDocumentID 07015690
GroupedDBID EFH
ID FETCH-uspatents_grants_070156903
IEDL.DBID EFH
IngestDate Sun Mar 05 22:47:02 EST 2023
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-uspatents_grants_070156903
OpenAccessLink https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7015690
ParticipantIDs uspatents_grants_07015690
PatentNumber 7015690
PublicationCentury 2000
PublicationDate 20060321
PublicationDateYYYYMMDD 2006-03-21
PublicationDate_xml – month: 03
  year: 2006
  text: 20060321
  day: 21
PublicationDecade 2000
PublicationYear 2006
References EP Search Report, EP05253068, Jul. 22, 2005.
(0512796) 19970800
(2262607) 19930600
Goldfine et al. (2005/0007106) 20050100
Patton et al. (5801532) 19980900
Granger, Jr. et al. (5903147) 19990500
Hedengren et al. (5262722) 19931100
Hedengren et al. (5463201) 19951000
Goldfine et al. (5793206) 19980800
Viertl et al. (4706020) 19871100
Young et al. (5182513) 19930100
Sutton, Jr. et al. (5442286) 19950800
Sutton, Jr. et al. (5315234) 19940500
Hedengren et al. (5371462) 19941200
(0047986) 20000800
Arnelo (3437918) 19690400
Gottfried-Gottfried et al. (5831431) 19981100
Hardy et al. (6344739) 20020200
Neumaier (3875502) 19750400
Hedengren et al. (5659248) 19970800
Goldfine et al. (5966011) 19991000
Hedengren (5371461) 19941200
Hedengren et al. (5389876) 19950200
Nath et al. (6414483) 20020700
Goldfine et al. (6188218) 20010200
Johnson et al. (5047719) 19910900
Frances (4310821) 19820100
References_xml – year: 19871100
  ident: 4706020
  contributor:
    fullname: Viertl et al.
– year: 19930600
  ident: 2262607
– year: 19820100
  ident: 4310821
  contributor:
    fullname: Frances
– year: 19940500
  ident: 5315234
  contributor:
    fullname: Sutton, Jr. et al.
– year: 19750400
  ident: 3875502
  contributor:
    fullname: Neumaier
– year: 20000800
  ident: 0047986
– year: 19970800
  ident: 5659248
  contributor:
    fullname: Hedengren et al.
– year: 19930100
  ident: 5182513
  contributor:
    fullname: Young et al.
– year: 19931100
  ident: 5262722
  contributor:
    fullname: Hedengren et al.
– year: 19980800
  ident: 5793206
  contributor:
    fullname: Goldfine et al.
– year: 19950200
  ident: 5389876
  contributor:
    fullname: Hedengren et al.
– year: 19980900
  ident: 5801532
  contributor:
    fullname: Patton et al.
– year: 19970800
  ident: 0512796
– year: 19981100
  ident: 5831431
  contributor:
    fullname: Gottfried-Gottfried et al.
– year: 20010200
  ident: 6188218
  contributor:
    fullname: Goldfine et al.
– year: 19690400
  ident: 3437918
  contributor:
    fullname: Arnelo
– year: 19951000
  ident: 5463201
  contributor:
    fullname: Hedengren et al.
– year: 19990500
  ident: 5903147
  contributor:
    fullname: Granger, Jr. et al.
– year: 20050100
  ident: 2005/0007106
  contributor:
    fullname: Goldfine et al.
– year: 19910900
  ident: 5047719
  contributor:
    fullname: Johnson et al.
– year: 20020200
  ident: 6344739
  contributor:
    fullname: Hardy et al.
– year: 19950800
  ident: 5442286
  contributor:
    fullname: Sutton, Jr. et al.
– year: 19991000
  ident: 5966011
  contributor:
    fullname: Goldfine et al.
– year: 19941200
  ident: 5371462
  contributor:
    fullname: Hedengren et al.
– year: 19941200
  ident: 5371461
  contributor:
    fullname: Hedengren
– year: 20020700
  ident: 6414483
  contributor:
    fullname: Nath et al.
Score 2.6453793
Snippet An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second...
SourceID uspatents
SourceType Open Access Repository
Title Omnidirectional eddy current probe and inspection system
URI https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7015690
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1NSwMxEB1qEbQnRcX6RQ5eo7VJdptz6bIIag8KvZVsk0jBZkt3i_jvnUmkeNFrAsmQMJl5w7wXgFulpRnmFelpewQoVeZ5pTGRs04pZUjD3BFR-Ok5K9_k40zNOlDuuDArdCO-Rluau22zbuvYXInPe7p4nsSfSSMwkPrAZ_iojZ1af58TJ1gjeN8bDai1b1KUPTjAJTBlC23zK2gUR7A_jaPH0HHhBEYvq7BMESSW35iz9ostkj4So49dHENYz5YhsR_rwJLM8imwYvI6Lvlum_n7htpX5oMfc8QZdBHGu3NgufbaLUwUWZNGSuNtbqWwCj1ICpH1of_nMhf_zF3CYSoLCD58uIJuu9m6awyUbXUTT-EbuXh0DA
link.rule.ids 230,309,783,805,888,64375
linkProvider USPTO
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LTwMhEJ401fg4adTY-uLgFR8FduWs3ayvugdNetuwBUwTyzbdbYz_3gFM40WvkAwTyDAP5vsAOBeSq0FaeT5tiwlKlVhaSQzktBFCKM9hbjxQ-HmU5G_8YSzGHchXWJgZmhGdoy7NxbKZt3VorsTrPR48jeTPniPQefaBT_dRK11oe5l6TLDE5H3NP0X55r5hlm_DJgrBoM21zS-3ke3AehFGd6Fj3B7cvMzcNPqQUIAjRusvMokMScR_7WIIJvZk6iL-sXYkEi3vA8mGr7c5XS1Tvi98A0t59aMQO4AuJvLmEEgqrTQTFWjWuOJcWZ1qzrRAG-KMJT3o_Smm_8_cGWwUd1n5dD96PIKtWCNgdHB9DN12sTQn6DXb6jRsyDeWrXcI
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Omnidirectional+eddy+current+probe+and+inspection+system&rft.inventor=Wang%2C+Changting&rft.inventor=Plotnikov%2C+Yuri+Alexeyevich&rft.inventor=Nath%2C+Shridhar+Champaknath&rft.inventor=McKnight%2C+William+Stewart&rft.inventor=Gambrell%2C+Gigi+Olive&rft.number=7015690&rft.date=2006-03-21&rft.externalDBID=n%2Fa&rft.externalDocID=07015690