Integrated circuit packages with reduced stress on die and associated substrates, assemblies, and systems
Mechanical stresses are reduced between an electronic component having relatively low fracture toughness and a substrate having relatively greater fracture toughness. In an embodiment, the component may be a die having mounting contacts formed of a low yield strength material, such as solder. A pack...
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Format | Patent |
Language | English |
Published |
24.01.2006
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Abstract | Mechanical stresses are reduced between an electronic component having relatively low fracture toughness and a substrate having relatively greater fracture toughness. In an embodiment, the component may be a die having mounting contacts formed of a low yield strength material, such as solder. A package substrate has columnar lands formed of a relatively higher yield strength material, such as copper, having a relatively higher melting point than the component contacts and having a relatively high current-carrying capacity. The component contacts may be hemispherical in shape. The lands may be substantially cylinders, truncated cones or pyramids, inverted truncated cones or pyramids, or other columnar shapes. Methods of fabrication, as well as application of the package to an electronic assembly and to an electronic system, are also described. |
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AbstractList | Mechanical stresses are reduced between an electronic component having relatively low fracture toughness and a substrate having relatively greater fracture toughness. In an embodiment, the component may be a die having mounting contacts formed of a low yield strength material, such as solder. A package substrate has columnar lands formed of a relatively higher yield strength material, such as copper, having a relatively higher melting point than the component contacts and having a relatively high current-carrying capacity. The component contacts may be hemispherical in shape. The lands may be substantially cylinders, truncated cones or pyramids, inverted truncated cones or pyramids, or other columnar shapes. Methods of fabrication, as well as application of the package to an electronic assembly and to an electronic system, are also described. |
Author | Hanna, Carlton Agraharam, Sairam Atluri, Vasudeva He, Dongming |
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References | Lan et al. (2003/0034565) 20030200 Sota (6201707) 20010300 Huang et al. (6571245) 20030500 Chen et al. (2003/0157747) 20030800 Harper, Electronic Packaging Interconnection Handbook, 1991, McGraw-Hill, 5.1-5.5. Wolf et al., Silicon Processing for the VLSI Era, 2000, vol. I, Lattice Press, 719-727, 791-795. |
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Snippet | Mechanical stresses are reduced between an electronic component having relatively low fracture toughness and a substrate having relatively greater fracture... |
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Title | Integrated circuit packages with reduced stress on die and associated substrates, assemblies, and systems |
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