Blackshear, E. D., Cipolla, T. M., & Coteus, P. W. (2005). Stress accommodation in electronic device interconnect technology for millimeter contact locations.
Chicago Style (17th ed.) CitationBlackshear, Edmund David, Thomas Mario Cipolla, and Paul William Coteus. Stress Accommodation in Electronic Device Interconnect Technology for Millimeter Contact Locations. 2005.
MLA (9th ed.) CitationBlackshear, Edmund David, et al. Stress Accommodation in Electronic Device Interconnect Technology for Millimeter Contact Locations. 2005.
Warning: These citations may not always be 100% accurate.