Method and apparatus to make a semiconductor chip susceptible to radiation failure
Methods and apparatus are provided for reducing the overall radiation hardness of a semiconductor chip. A radiation detector and a failure memory are provided. A disable signal or signals is produced by the failure memory. The disable signal is a required input to a user logic function, such as an o...
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Format | Patent |
Language | English |
Published |
21.06.2005
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Online Access | Get full text |
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Abstract | Methods and apparatus are provided for reducing the overall radiation hardness of a semiconductor chip. A radiation detector and a failure memory are provided. A disable signal or signals is produced by the failure memory. The disable signal is a required input to a user logic function, such as an off chip driver, an off chip receiver, a clock, or a static random access memory. When the radiation detector detects radiation, that detection is stored in the failure memory. The disable signal, when active, causes some or all of the user function to be inoperative. This invention is particularly important when the semiconductor chip is produced in a silicon on insulator (SOI) Complementary Metal Oxide Semiconductor (CMOS) process, which is naturally radiation resistant. |
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AbstractList | Methods and apparatus are provided for reducing the overall radiation hardness of a semiconductor chip. A radiation detector and a failure memory are provided. A disable signal or signals is produced by the failure memory. The disable signal is a required input to a user logic function, such as an off chip driver, an off chip receiver, a clock, or a static random access memory. When the radiation detector detects radiation, that detection is stored in the failure memory. The disable signal, when active, causes some or all of the user function to be inoperative. This invention is particularly important when the semiconductor chip is produced in a silicon on insulator (SOI) Complementary Metal Oxide Semiconductor (CMOS) process, which is naturally radiation resistant. |
Author | Rohn, Michael James Van Phan, Nghia Friend, David Michael |
Author_xml | – sequence: 1 givenname: David Michael surname: Friend fullname: Friend, David Michael – sequence: 2 givenname: Nghia surname: Van Phan fullname: Van Phan, Nghia – sequence: 3 givenname: Michael James surname: Rohn fullname: Rohn, Michael James |
BookMark | eNqNyj0KAjEQQOEUWvh3h7mAsCIKW4tiYyP2Miaz7rDZTMhM7q8LHsDi8TVv6WZJEi3c_UbWSwBM33LGglYVTGDEgQBBaWQvKVRvUsD3nEGresrGr0jTWDAwGkuCDjnWQms37zAqbX6uHFzOj9N1WzWjUTJ9vgtONMe2aXeHdv_H8gEGdjrm |
ContentType | Patent |
CorporateAuthor | International Business Machines Corporation |
CorporateAuthor_xml | – name: International Business Machines Corporation |
DBID | EFH |
DatabaseName | USPTO Issued Patents |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EFH name: USPTO Issued Patents url: http://www.uspto.gov/patft/index.html sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
ExternalDocumentID | 06909159 |
GroupedDBID | EFH |
ID | FETCH-uspatents_grants_069091593 |
IEDL.DBID | EFH |
IngestDate | Sun Mar 05 22:32:43 EST 2023 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-uspatents_grants_069091593 |
OpenAccessLink | https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6909159 |
ParticipantIDs | uspatents_grants_06909159 |
PatentNumber | 6909159 |
PublicationCentury | 2000 |
PublicationDate | 20050621 |
PublicationDateYYYYMMDD | 2005-06-21 |
PublicationDate_xml | – month: 06 year: 2005 text: 20050621 day: 21 |
PublicationDecade | 2000 |
PublicationYear | 2005 |
References | Pedersen et al. (5067106) 19911100 Cappels (5736930) 19980400 |
References_xml | – year: 19911100 ident: 5067106 contributor: fullname: Pedersen et al. – year: 19980400 ident: 5736930 contributor: fullname: Cappels |
Score | 2.626648 |
Snippet | Methods and apparatus are provided for reducing the overall radiation hardness of a semiconductor chip. A radiation detector and a failure memory are provided.... |
SourceID | uspatents |
SourceType | Open Access Repository |
Title | Method and apparatus to make a semiconductor chip susceptible to radiation failure |
URI | https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6909159 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfZ3PS8MwFMcf2xDUk6Li_EUOXqPtlqXLWVaKoAxR2G2kTaLDrS1Ni_--72UyvOg1CY9HQvLyhW8-Abgdq1wTxpxPpDZcCKu4ljbmJjYmGUvlnA0G2WeZvYnHxWTRg2z3FmaD24jXmIu_63zdVsFcicf7duH5Fv5MjMCS6ANf5brSZm7cPao8haW5D_1pRNauWZodwj6GwCtb2fpfRSM9gr15aD2Gni1P4OUpfNbMULozXQfkdudZW7GN_rRMM0829aok_mrVsOJjVTPf-eA6ydeWBjbEEaCJZE6vyE5-CiydvT5kfJfA8r0hY8sy-kl0fAYDFPj2HJgVBaq4OHcil6JIrHajJEGhUygzLZSMhzD8M8zFP32XcBBAo5Hko_gKBm3T2WssoW1-E-bnGy2efl4 |
link.rule.ids | 230,309,786,808,891,64394 |
linkProvider | USPTO |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfZ3bT8MgFMZP5jRenjRqnFcefEXXlVF51jX1tjRGk70ttIAubm1T2vjvy2Fm8UVfgZycQODwJR8_AC5DkUnEmNMhl4oypgWVXAdUBUpFIRfGaG-QHfPkjT1MhpMOJKu3MAu3jWjlcrFXra2a0psr3fG-XHi6hD8jI7BA-sBXMS-lSpW5dipPuNK8ButYY5GiP4qTHdhyQdylrWjsr7IR78JG6lv3oKOLfXh59t81Eyfeiaw8dLu1pCnJQn5qIolFo3pZIIG1rEn-MauIba33nWRzjQNrJAngVBIjZ2goPwASj15vE7pKYPpeo7Vl2v9JNTyErpP4-giIZrnTcUFmWMZZHmlpBlHkpE4u1E0ueNCD3p9hjv_pu4DN9C6ePt2PH09g21NH-5wOglPoNnWrz1w9bbJzP1XfhfmBWA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Method+and+apparatus+to+make+a+semiconductor+chip+susceptible+to+radiation+failure&rft.inventor=Friend%2C+David+Michael&rft.inventor=Van+Phan%2C+Nghia&rft.inventor=Rohn%2C+Michael+James&rft.number=6909159&rft.date=2005-06-21&rft.externalDBID=n%2Fa&rft.externalDocID=06909159 |