Method and apparatus for inferring item position based on multiple data

A method and apparatus which determine the location of one component on an article relative to a datum position on the article at a first location in the manufacturing process and then subsequently locating the datum position on the article at a second location in the manufacturing process and deter...

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Main Authors Gimenez, Joseph J, Dollevoet, Tim G, Vogt, Brian R, Clark, Clinton D
Format Patent
LanguageEnglish
Published 31.05.2005
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Abstract A method and apparatus which determine the location of one component on an article relative to a datum position on the article at a first location in the manufacturing process and then subsequently locating the datum position on the article at a second location in the manufacturing process and determining if the distance from another component to the datum position. The location of two components relative to one another can be determined by comparing their positions relative to the datum position. In a manufacturing process for producing articles such as children's training pants, cameras and a radiation source can be utilized to determine the positions of fastening components on the training pants when they are hidden within the pants.
AbstractList A method and apparatus which determine the location of one component on an article relative to a datum position on the article at a first location in the manufacturing process and then subsequently locating the datum position on the article at a second location in the manufacturing process and determining if the distance from another component to the datum position. The location of two components relative to one another can be determined by comparing their positions relative to the datum position. In a manufacturing process for producing articles such as children's training pants, cameras and a radiation source can be utilized to determine the positions of fastening components on the training pants when they are hidden within the pants.
Author Gimenez, Joseph J
Dollevoet, Tim G
Vogt, Brian R
Clark, Clinton D
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