System and method for filling gaps of missing data using source specified data
A method and apparatus are provided for filling a gap of missing data using source specified data. The method includes analyzing a first set of data representative of utility consumption for a plurality of days to determine clusters of days of the week having similar utility consumption. The method...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
01.03.2005
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Online Access | Get full text |
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Abstract | A method and apparatus are provided for filling a gap of missing data using source specified data. The method includes analyzing a first set of data representative of utility consumption for a plurality of days to determine clusters of days of the week having similar utility consumption. The method further includes generating an individual profile of utility consumption for each cluster, and copying data from at least one individual profile into the gap to form a second set of data without any gaps. A system for filling a gap of missing data using source specified data includes a microprocessor programmed to copy data from at least one individual profile into the gap, and to adjust the copied data up or down to account for local trend information adjacent to the gap. |
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AbstractList | A method and apparatus are provided for filling a gap of missing data using source specified data. The method includes analyzing a first set of data representative of utility consumption for a plurality of days to determine clusters of days of the week having similar utility consumption. The method further includes generating an individual profile of utility consumption for each cluster, and copying data from at least one individual profile into the gap to form a second set of data without any gaps. A system for filling a gap of missing data using source specified data includes a microprocessor programmed to copy data from at least one individual profile into the gap, and to adjust the copied data up or down to account for local trend information adjacent to the gap. |
Author | Seem, John E Welch, Henry L |
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References | Dhillon et al. (6560597) 20030500 Huneycutt (20020191024) 20021200 Tanaka et al. (6616759) 20030900 Kiluk (4990893) 19910200 Grossman et al. (5889799) 19990300 Ramaswamy et al. (20030061249) 20030300 (WO 9321587) 19931000 Dawes (6424929) 20020700 Budike, Jr. (6122603) 20000900 Tabor (20030014205) 20030100 Kishlock et al. (20010020219) 20010900 Cmar (5566084) 19961000 Sematech, "The Engineering Statistics Internet (ESI) Handbook: Grubbs' Test for Outliers.". Carey et al., "Resistant and Test-Based Outlier Rejection: Effects on Gaussian One- and Two-Sample Inference" Technometrics, vol. 39, No. 3., Aug. 1997. Jensen et al. (5555195) 19960900 |
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