Sub-micron Hard X-ray Fluorescence Imaging of Synthetic Elements

• Published in: Analytica chimica acta Vol. 722; pp. 21 - 28
• Main Authors: Jensen, Mark P., Aryal, Baikuntha P., Gorman-Lewis, Drew, Paunesku, Tatjana, Lai, Barry, Vogt, Stefan, Woloschak, Gayle E.
• Format: Journal Article
• Language: English
• Published: 13.02.2012

Synchrotron-based X-ray fluorescence microscopy (SXFM) using hard X-rays focused into sub-micron spots is a powerful technique for elemental quantification and mapping, as well as microspectroscopic measurement such as μ-XANES (X-ray absorption near edge structure). We have used SXFM to image and si...