SEM Characterization of ZnO Thin Films Deposited by Dip-Coating Technique
In this study, ZnO thin films were deposited on the silicon substrate by using dip-coating method. To prepare zinc solution, zinc acetate dehydrate was used as starting material and dissolved in 2-methoexyethanol. Monoethanolamine was used in this solution as stabilizer. Then, the solution was stirr...
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Published in | AIP conference proceedings Vol. 1136; pp. 786 - 789 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
21.11.2008
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Online Access | Get full text |
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Abstract | In this study, ZnO thin films were deposited on the silicon substrate by using dip-coating method. To prepare zinc solution, zinc acetate dehydrate was used as starting material and dissolved in 2-methoexyethanol. Monoethanolamine was used in this solution as stabilizer. Then, the solution was stirred at 60 deg C for one hour and stayed at room temperature for one night Thin film was obtained by dip coating the solution on silicon substrates at different withdrawal speeds. The effect of different withdrawal speed on the surface morphology of the ZnO thin film was investigated scanning electron microscope (SEM).The SEM image showed that the grain size has decreased as speed increased. |
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AbstractList | In this study, ZnO thin films were deposited on the silicon substrate by using dip-coating method. To prepare zinc solution, zinc acetate dehydrate was used as starting material and dissolved in 2-methoexyethanol. Monoethanolamine was used in this solution as stabilizer. Then, the solution was stirred at 60 deg C for one hour and stayed at room temperature for one night Thin film was obtained by dip coating the solution on silicon substrates at different withdrawal speeds. The effect of different withdrawal speed on the surface morphology of the ZnO thin film was investigated scanning electron microscope (SEM).The SEM image showed that the grain size has decreased as speed increased. |
Author | Amizam, S Zakaria, N Z Rusop, M |
Author_xml | – sequence: 1 givenname: N surname: Zakaria middlename: Z fullname: Zakaria, N Z – sequence: 2 givenname: S surname: Amizam fullname: Amizam, S – sequence: 3 givenname: M surname: Rusop fullname: Rusop, M |
BookMark | eNqNyr0OgjAUQOEOmAjqO9zJjaRSDDLzEx2MgwzGhVS8SE1pkQuDPr0MPoDTGc7nMcdYgw5zOY9DPwjFZc48oifnQRxFO5cdztkRkkb2shqwVx85KGvA1nA1JygaZSBXuiVIsbOkBrzD7Q2p6vzETtQ8oMCqMeo14pLNaqkJV78u2DrPimTvd72dNg1lq6hCraVBO1IptjzciE0g_oZfnB8_1g |
ContentType | Journal Article |
DBID | 7U5 8FD L7M |
DatabaseName | Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
DatabaseTitle | Technology Research Database Solid State and Superconductivity Abstracts Advanced Technologies Database with Aerospace |
DatabaseTitleList | Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Physics |
EndPage | 789 |
GroupedDBID | -~X 23M 5GY 6IK 7U5 8FD AAAAW AABDS AAEUA AAPUP AAYIH ABJNI ACBRY ACZLF ADCTM AEJMO AFATG AFHCQ AGKCL AGLKD AGMXG AGTJO AHSDT AJJCW ALEPV ALMA_UNASSIGNED_HOLDINGS ATXIE AWQPM BPZLN ESX F5P FDOHQ FFFMQ HAM IPLJI L7M M71 M73 RIE RIP RQS SJN ~02 |
ID | FETCH-proquest_miscellaneous_350413123 |
ISSN | 0094-243X |
IngestDate | Fri Aug 16 22:05:03 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Language | English |
LinkModel | OpenURL |
MergedId | FETCHMERGED-proquest_miscellaneous_350413123 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 content type line 23 ObjectType-Feature-1 |
PQID | 35041312 |
PQPubID | 23500 |
ParticipantIDs | proquest_miscellaneous_35041312 |
PublicationCentury | 2000 |
PublicationDate | 20081121 |
PublicationDateYYYYMMDD | 2008-11-21 |
PublicationDate_xml | – month: 11 year: 2008 text: 20081121 day: 21 |
PublicationDecade | 2000 |
PublicationTitle | AIP conference proceedings |
PublicationYear | 2008 |
SSID | ssj0029778 |
Score | 3.6401694 |
Snippet | In this study, ZnO thin films were deposited on the silicon substrate by using dip-coating method. To prepare zinc solution, zinc acetate dehydrate was used as... |
SourceID | proquest |
SourceType | Aggregation Database |
StartPage | 786 |
Title | SEM Characterization of ZnO Thin Films Deposited by Dip-Coating Technique |
URI | https://search.proquest.com/docview/35041312 |
Volume | 1136 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS8MwFD64geCLeMW7eRBfpLLZdrWPZW5ssotoB2MvJelSGHPtsNuD-_WepEszLzD1JbShpOE7JOfLuQXgCk_-POQWrjRajgzLZmJJRbbBqWNS1KgVkwt7R7tTafSsx77d17cgyOySGbsNFz_mlfxHqtiHchVZsn-QbD4oduAzyhdblDC2v5LxS60t_eVZxeVFzv4GcVdeyHlTH71OUtxTZGhWxjUfRlOjmlAZ7eyrAq6rFNVrPolYdFV_Vmu4nH0P6BhP2JJ1drRnw5vgDCafrKnP8zSZapOrMi7ciyy7LGNZbZiuZdxZ8spevWGWzdU9z1G1rJdvrlYtyp3e6Qb1XqsV-LW-X4CCWbazTLv8aIwsNNOZy99904xS3fs7sL3k6cTLQN-FDR7vwaaMlw3TfWgi9OQr9CSJCEJPBPREQk9y6Al7JyvQkxz6A7iu1_xqw1AzCXDlCXcKjXkyTwPTLiEDQM1_CMU4ifkRkAjVmMvdoRUNkdcxl7FS6AgSyqlZcahzDJdrBjtZ-8UpbGlJnUFx9jbn50iMZuxCYvoBmvkaUg |
link.rule.ids | 315,786,790 |
linkProvider | IEEE |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=SEM+Characterization+of+ZnO+Thin+Films+Deposited+by+Dip-Coating+Technique&rft.jtitle=AIP+conference+proceedings&rft.au=Zakaria%2C+N+Z&rft.au=Amizam%2C+S&rft.au=Rusop%2C+M&rft.date=2008-11-21&rft.issn=0094-243X&rft.volume=1136&rft.spage=786&rft.epage=789&rft.externalDBID=NO_FULL_TEXT |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0094-243X&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0094-243X&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0094-243X&client=summon |