Reliable synaptic plasticity of InGaZnO transistor with TiO2interlayer
We demonstrate an InGaZnO (IGZO)-based synaptic transistor with a TiO2buffer layer. The structure of the synaptic transistor with TiO2inserted between the Ti metal electrode and an IGZO semiconductor channel O2trapping layer produces a large hysteresis window, which is crucial for achieving synaptic...
Saved in:
Published in | Nanotechnology Vol. 35; no. 11 |
---|---|
Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
29.12.2023
|
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!