Infrared characterization of SrTiO(3) thin films using attenuated total reflectance

• Published in: IEEE transactions on applied superconductivity Vol. 7; no. 2; pp. 1628 - 1631
• Main Authors: Mueller, C H, Galt, D, Treece, R E, Rivkin, T V, Webb, J D, Moutinho, H R, Dalberth, M, Rogers, C T
• Format: Journal Article
• Language: English
• Published: 01.06.1997

Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm(-1) of SrTiO (3) thin films deposited either directly on LaAlO(3), or on YBCO-coated LaAlO(3) single crystal substrates. In the s-polarized spectra, the transverse optic Ti-O stretching vibrat...