Infrared characterization of SrTiO(3) thin films using attenuated total reflectance

Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm(-1) of SrTiO (3) thin films deposited either directly on LaAlO(3), or on YBCO-coated LaAlO(3) single crystal substrates. In the s-polarized spectra, the transverse optic Ti-O stretching vibrat...

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Published inIEEE transactions on applied superconductivity Vol. 7; no. 2; pp. 1628 - 1631
Main Authors Mueller, C H, Galt, D, Treece, R E, Rivkin, T V, Webb, J D, Moutinho, H R, Dalberth, M, Rogers, C T
Format Journal Article
LanguageEnglish
Published 01.06.1997
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Abstract Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm(-1) of SrTiO (3) thin films deposited either directly on LaAlO(3), or on YBCO-coated LaAlO(3) single crystal substrates. In the s-polarized spectra, the transverse optic Ti-O stretching vibration shifted to lower frequencies as the film thickness increased, which was attributed to damping caused by the generation of lower frequency phonon modes. The transverse Ti-O stretching vibration was also observed in the p-polarized spectra, but was more heavily damped, which indicates the damping is more pronounced when the electric field has a component perpendicular to the film surface. Damping of the transverse modes was attributed to coupling of these modes to other phonon modes, and may be a source of the high losses at microwave frequencies
AbstractList Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm(-1) of SrTiO (3) thin films deposited either directly on LaAlO(3), or on YBCO-coated LaAlO(3) single crystal substrates. In the s-polarized spectra, the transverse optic Ti-O stretching vibration shifted to lower frequencies as the film thickness increased, which was attributed to damping caused by the generation of lower frequency phonon modes. The transverse Ti-O stretching vibration was also observed in the p-polarized spectra, but was more heavily damped, which indicates the damping is more pronounced when the electric field has a component perpendicular to the film surface. Damping of the transverse modes was attributed to coupling of these modes to other phonon modes, and may be a source of the high losses at microwave frequencies
Author Treece, R E
Dalberth, M
Rogers, C T
Moutinho, H R
Mueller, C H
Galt, D
Rivkin, T V
Webb, J D
Author_xml – sequence: 1
  givenname: C
  surname: Mueller
  middlename: H
  fullname: Mueller, C H
– sequence: 2
  givenname: D
  surname: Galt
  fullname: Galt, D
– sequence: 3
  givenname: R
  surname: Treece
  middlename: E
  fullname: Treece, R E
– sequence: 4
  givenname: T
  surname: Rivkin
  middlename: V
  fullname: Rivkin, T V
– sequence: 5
  givenname: J
  surname: Webb
  middlename: D
  fullname: Webb, J D
– sequence: 6
  givenname: H
  surname: Moutinho
  middlename: R
  fullname: Moutinho, H R
– sequence: 7
  givenname: M
  surname: Dalberth
  fullname: Dalberth, M
– sequence: 8
  givenname: C
  surname: Rogers
  middlename: T
  fullname: Rogers, C T
BookMark eNqNyzFuAjEQQFEXRAICBTdwhaAAbO8ua-qICCoK6NHIjMHIjBN7tuH0pOAAqX7z_lD0KBEKMdFqqbXarNp2uTbK2k1PDLRq9MIaU_XFsJS7Urq2dTMQxz35DBkv0t0gg2PM4QkcEsnk5TGfwmFWzSXfAkkf4qPIrgS6SmBG6oD_Rk4MUWb0ER0DORyJDw-x4PjdTzH93p6-doufnH47LHx-hOIwRiBMXTkbWyvTVG31b_gC689H5A
ContentType Journal Article
DBID 7U5
8FD
L7M
DOI 10.1109/77.620889
DatabaseName Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle Technology Research Database
Solid State and Superconductivity Abstracts
Advanced Technologies Database with Aerospace
DatabaseTitleList Technology Research Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EndPage 1631
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
6IK
7U5
8FD
AAJGR
ABQJQ
ACGFO
ACGFS
ACIWK
AENEX
AI.
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
DU5
EBS
EJD
F5P
HZ~
H~9
IFIPE
IFJZH
IPLJI
JAVBF
L7M
LAI
M43
MS~
O9-
OCL
P2P
PZZ
RIE
RIG
RNS
TN5
VH1
ID FETCH-proquest_miscellaneous_284025373
ISSN 1051-8223
IngestDate Sat Aug 17 01:52:41 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 2
Language English
LinkModel OpenURL
MergedId FETCHMERGED-proquest_miscellaneous_284025373
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
content type line 23
ObjectType-Feature-1
PQID 28402537
PQPubID 23500
ParticipantIDs proquest_miscellaneous_28402537
PublicationCentury 1900
PublicationDate 19970601
PublicationDateYYYYMMDD 1997-06-01
PublicationDate_xml – month: 06
  year: 1997
  text: 19970601
  day: 01
PublicationDecade 1990
PublicationTitle IEEE transactions on applied superconductivity
PublicationYear 1997
SSID ssj0014845
Score 3.0061786
Snippet Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm(-1) of SrTiO (3) thin films deposited either...
SourceID proquest
SourceType Aggregation Database
StartPage 1628
Title Infrared characterization of SrTiO(3) thin films using attenuated total reflectance
URI https://search.proquest.com/docview/28402537
Volume 7
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS8MwFA46EfRBdCrezYOIItVuzXp5FNmcMjfYOthbSdcUBtpKLz7s13uSphedMPWlbGWE0vMt-ZJzvu8gdKHxdkik6SkeVX2FuKqlUF2kC3Wzwe3XTY_rnV_6endMnietSWmoINQliXs7nf-oK_lPVOEexJWrZP8Q2WJQuAGfIb5whQjD9Vcxfgr8SBSQTwvb5XlBAUeRPRsAf-RHqUAvZwH3YHqLb1JxOsBtNYOUcr6ZhJm7v89P8AsQSMLKN4O8j0TeVFxkF6ikrnH6ziLYUHPPWNGEogwfKySGpfzhkb4mX4qM7Yix7BB_WCoihrMP2SLMlhW4nlTpGWXxlJxH4b-uAPfQqhOtUcFTszJpNnSpD2fya7YuLE7uwhvVMG71Ji_OKlewPGvfHzidca_n2O2JvYrWuDciySR9RWKJmKJvdfF80mwKhr4rBl5YlgXXsLfRltwk4Pss4jtohQV1tFmxjqyjdVG6O4130ShHAf6OAhz6WKDgSrvGHAFYIAALBOASAVggAFcQsIcuO237oavkT-jAdMBzPDRgYRo7wDaAxWqGto9qQRiwA4Qtv6F7nqlS120RYmkunfoedX1iMBW2s9YhOl8y2NHSXxyjjRIGJ6iWRCk7BbaWuGfi_X8CQdFILg
link.rule.ids 314,780,784,27924,27925
linkProvider IEEE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Infrared+characterization+of+SrTiO%283%29+thin+films+using+attenuated+total+reflectance&rft.jtitle=IEEE+transactions+on+applied+superconductivity&rft.au=Mueller%2C+C+H&rft.au=Galt%2C+D&rft.au=Treece%2C+R+E&rft.au=Rivkin%2C+T+V&rft.date=1997-06-01&rft.issn=1051-8223&rft.volume=7&rft.issue=2&rft.spage=1628&rft.epage=1631&rft_id=info:doi/10.1109%2F77.620889&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-8223&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-8223&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-8223&client=summon