Free-Electron Ramsey-Type Interferometry for Enhanced Amplitude and Phase imaging of Nearfields
The complex range of interactions between electrons and electromagnetic fields gave rise to countless scientific and technological advances. A prime example is photon-induced nearfield electron microscopy (PINEM), enabling the detection of confined electric fields in illuminated nanostructures with...
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Published in | arXiv.org |
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Main Authors | , , , , , , |
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Cornell University Library, arXiv.org
04.05.2023
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Abstract | The complex range of interactions between electrons and electromagnetic fields gave rise to countless scientific and technological advances. A prime example is photon-induced nearfield electron microscopy (PINEM), enabling the detection of confined electric fields in illuminated nanostructures with unprecedented spatial resolution. However, PINEM is limited by its dependence on strong fields, making it unsuitable for sensitive samples, and its inability to resolve complex phasor information. Here, we leverage the nonlinear, over-constrained nature of PINEM to present an algorithmic microscopy approach, achieving far superior nearfield imaging capabilities. Our algorithm relies on free-electron Ramsey-type interferometry to produce orders-of-magnitude improvement in sensitivity and ambiguity-immune nearfield phase reconstruction, both of which are optimal when the electron exhibits a fully quantum behavior. Our results demonstrate the potential of combining algorithmic approaches with novel modalities in electron microscopy, and may lead to various applications from imaging sensitive biological samples to performing full-field tomography of confined light. |
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AbstractList | The complex range of interactions between electrons and electromagnetic fields gave rise to countless scientific and technological advances. A prime example is photon-induced nearfield electron microscopy (PINEM), enabling the detection of confined electric fields in illuminated nanostructures with unprecedented spatial resolution. However, PINEM is limited by its dependence on strong fields, making it unsuitable for sensitive samples, and its inability to resolve complex phasor information. Here, we leverage the nonlinear, over-constrained nature of PINEM to present an algorithmic microscopy approach, achieving far superior nearfield imaging capabilities. Our algorithm relies on free-electron Ramsey-type interferometry to produce orders-of-magnitude improvement in sensitivity and ambiguity-immune nearfield phase reconstruction, both of which are optimal when the electron exhibits a fully quantum behavior. Our results demonstrate the potential of combining algorithmic approaches with novel modalities in electron microscopy, and may lead to various applications from imaging sensitive biological samples to performing full-field tomography of confined light. |
Author | Bucher, Tomer Tsesses, Shai Kaminer, Ido Bartal, Guy Vanacore, Giovanni Maria Dahan, Raphael Ruimy, Ron |
Author_xml | – sequence: 1 givenname: Tomer surname: Bucher fullname: Bucher, Tomer – sequence: 2 givenname: Ron surname: Ruimy fullname: Ruimy, Ron – sequence: 3 givenname: Shai surname: Tsesses fullname: Tsesses, Shai – sequence: 4 givenname: Raphael surname: Dahan fullname: Dahan, Raphael – sequence: 5 givenname: Guy surname: Bartal fullname: Bartal, Guy – sequence: 6 givenname: Giovanni surname: Vanacore middlename: Maria fullname: Vanacore, Giovanni Maria – sequence: 7 givenname: Ido surname: Kaminer fullname: Kaminer, Ido |
BookMark | eNqNys8KgkAQgPElCvrnOwx0FmzMsmOEUZeI8C6Lzpahsza7Hnz7OvQAnb7D75urMVumkZphHK_DdIM4VYFzryiKcLvDJIlnqjgJUZg1VHqxDHfdOhrCfOgILuxJDIltycsAxgpk_NRcUgWHtmtq31cEmiu4PbUjqFv9qPkB1sCVtJiamsot1cToxlHw60KtTll-PIed2HdPzhcv2wt_qcA02u-3iLiO_7s-DJ9GEg |
ContentType | Paper |
Copyright | 2023. This work is published under http://creativecommons.org/licenses/by-sa/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
Copyright_xml | – notice: 2023. This work is published under http://creativecommons.org/licenses/by-sa/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
DBID | 8FE 8FG ABJCF ABUWG AFKRA AZQEC BENPR BGLVJ CCPQU DWQXO HCIFZ L6V M7S PIMPY PQEST PQQKQ PQUKI PRINS PTHSS |
DatabaseName | ProQuest SciTech Collection ProQuest Technology Collection Materials Science & Engineering Collection ProQuest Central (Alumni) ProQuest Central ProQuest Central Essentials AUTh Library subscriptions: ProQuest Central Technology Collection ProQuest One Community College ProQuest Central SciTech Premium Collection ProQuest Engineering Collection Engineering Database Publicly Available Content Database ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Academic ProQuest One Academic UKI Edition ProQuest Central China Engineering Collection |
DatabaseTitle | Publicly Available Content Database Engineering Database Technology Collection ProQuest Central Essentials ProQuest One Academic Eastern Edition ProQuest Central (Alumni Edition) SciTech Premium Collection ProQuest One Community College ProQuest Technology Collection ProQuest SciTech Collection ProQuest Central China ProQuest Central ProQuest Engineering Collection ProQuest One Academic UKI Edition ProQuest Central Korea Materials Science & Engineering Collection ProQuest One Academic Engineering Collection |
DatabaseTitleList | Publicly Available Content Database |
Database_xml | – sequence: 1 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Physics |
EISSN | 2331-8422 |
Genre | Working Paper/Pre-Print |
GroupedDBID | 8FE 8FG ABJCF ABUWG AFKRA ALMA_UNASSIGNED_HOLDINGS AZQEC BENPR BGLVJ CCPQU DWQXO FRJ HCIFZ L6V M7S M~E PIMPY PQEST PQQKQ PQUKI PRINS PTHSS |
ID | FETCH-proquest_journals_28099622213 |
IEDL.DBID | 8FG |
IngestDate | Thu Oct 10 19:34:37 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-proquest_journals_28099622213 |
OpenAccessLink | https://www.proquest.com/docview/2809962221?pq-origsite=%requestingapplication% |
PQID | 2809962221 |
PQPubID | 2050157 |
ParticipantIDs | proquest_journals_2809962221 |
PublicationCentury | 2000 |
PublicationDate | 20230504 |
PublicationDateYYYYMMDD | 2023-05-04 |
PublicationDate_xml | – month: 05 year: 2023 text: 20230504 day: 04 |
PublicationDecade | 2020 |
PublicationPlace | Ithaca |
PublicationPlace_xml | – name: Ithaca |
PublicationTitle | arXiv.org |
PublicationYear | 2023 |
Publisher | Cornell University Library, arXiv.org |
Publisher_xml | – name: Cornell University Library, arXiv.org |
SSID | ssj0002672553 |
Score | 3.4735525 |
SecondaryResourceType | preprint |
Snippet | The complex range of interactions between electrons and electromagnetic fields gave rise to countless scientific and technological advances. A prime example is... |
SourceID | proquest |
SourceType | Aggregation Database |
SubjectTerms | Algorithms Biological properties Electric fields Electromagnetic fields Electron microscopy Free electrons Image reconstruction Interferometry Near fields Phasors Spatial resolution |
Title | Free-Electron Ramsey-Type Interferometry for Enhanced Amplitude and Phase imaging of Nearfields |
URI | https://www.proquest.com/docview/2809962221 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3NS8MwFH_oiuBtfqFujoBeg2vTz5OotA5hpQyF3UrSpMzD2tnWwy7-7b6ETg_Cjo9ASMLjff7yfgB3EfMKe1p4VLiSYYLCOA0FitJRQYGSz5Tu6M5Tf_buvi69ZV9wa3tY5c4mGkMt60LXyO-dEGMZH72Z_bD5pJo1SndXewqNQ7BsPQlP_xRPXn5rLI4fYMTM_plZ4zuSIVgZ36jmBA5UdQpHBnJZtGeQJ41SNO5paMiCr1u1pTovJKZMVyo9SaBrtgTjShJXK9OrJ48aAq4HUhJeSZKt0AuRj7XhGiJ1SVLUXINKa8_hNonfnmd0d6q815s2_7slu4BBVVfqEggLuRNKN1JRwFzMhCOvFCXjYupIDMcicQXjfTtd718ewbGmUDcgPncMg675UjfoaDsxMa85AespTrMFSvPv-AfxIolz |
link.rule.ids | 786,790,12792,21416,33408,33779,43635,43840 |
linkProvider | ProQuest |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8QwEB60RfTmEx-rBvRa3G3S10lUWqrulrKssLeStinrYdu1rYf9905CVg_CHodASEKYbx4f8wHcB9QpRsPCsXJWUkxQKLf8HM3SFl6BlkuF7OhOEjf-YG9zZ64Lbp2mVW58onLUZVPIGvmD7WMs4yKajR5XX5ZUjZLdVS2hsQsmo5iqGGA-h0k6_a2y2K6HMTP952gVekSHYKZ8Jdoj2BH1Mewp0mXRnUAWtUJYoRaiIVO-7MTakpkhUYW6SshZAn27JhhZkrBeqG49eZIkcDmSkvC6JOkCcYh8LpXaEGkqkuDfVby07hTuonD2ElubU2X653TZ3z3pGRh1U4tzINTntl-yQAQeZZgLB06VV5TnQ7vEgCzIL2CwbafL7cu3sB_PJuNs_Jq8X8GBFFRXlD42AKNvv8U1wm6f3-i3_QFFDor4 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Free-Electron+Ramsey-Type+Interferometry+for+Enhanced+Amplitude+and+Phase+imaging+of+Nearfields&rft.jtitle=arXiv.org&rft.au=Bucher%2C+Tomer&rft.au=Ruimy%2C+Ron&rft.au=Tsesses%2C+Shai&rft.au=Dahan%2C+Raphael&rft.date=2023-05-04&rft.pub=Cornell+University+Library%2C+arXiv.org&rft.eissn=2331-8422 |