Elemental depth profiling of fluoridated hydroxyapatite by X-ray photoelectron spectroscopy

Structural and chemical changes that arise from a fluoridation of synthetic hydroxyapatite in neutral and acidic fluoridation agents are investigated. For synthetic hydroxyapatite (Ca5(PO4)3OH = HAp), the elemental depth profiles were determined by X-ray photoelectron spectroscopy (XPS) to reveal th...

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Published inarXiv.org
Main Authors Mueller, Frank, Zeitz, Christian, Mantz, Hubert, Karl-Heinz Ehses, Soldera, Flavio, Hannig, Matthias, Huefner, Stefan, Jacobs, Karin
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LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 09.06.2008
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Abstract Structural and chemical changes that arise from a fluoridation of synthetic hydroxyapatite in neutral and acidic fluoridation agents are investigated. For synthetic hydroxyapatite (Ca5(PO4)3OH = HAp), the elemental depth profiles were determined by X-ray photoelectron spectroscopy (XPS) to reveal the effect of fluoridation in nearly neutral (pH = 6.2) and acidic agents (pH = 4.2). Due to the high surface sensitivity of the technique, the depth profiles have a resolution on the nm scale. With respect to the chemical composition and the crystal structure XPS depth profiling revealed very different effects of the two treatments. In both cases, however, the fluoridation affects the surface only on the nm scale which is in contrast to recent literature, where a penetration depth up to several microns was reported. Moreover, evidence is given that the actual fluoridation depth depends on the pH value. Recently, a qualitative three layer model was proposed for the fluoridation of HAp in an acidic agent. In addition to the elemental depth profile, as presented also by various other authors, we present a quantitative depth profile of the compounds CaF2, Ca(OH)2 and fluorapatite (FAp) that are predicted by the three layer model. The analysis of our experimental data exactly reproduces the structural order of the model, however, on a scale that differs by nearly two orders of magnitude from previous predictions. Our results also reveal that the amount of Ca(OH)2 and FAp is small as compared to that of CaF2. Therefore, it has to be questioned whether such narrow Ca(OH)2 and FAp layers really can act as protective layers for the enamel.
AbstractList Structural and chemical changes that arise from a fluoridation of synthetic hydroxyapatite in neutral and acidic fluoridation agents are investigated. For synthetic hydroxyapatite (Ca5(PO4)3OH = HAp), the elemental depth profiles were determined by X-ray photoelectron spectroscopy (XPS) to reveal the effect of fluoridation in nearly neutral (pH = 6.2) and acidic agents (pH = 4.2). Due to the high surface sensitivity of the technique, the depth profiles have a resolution on the nm scale. With respect to the chemical composition and the crystal structure XPS depth profiling revealed very different effects of the two treatments. In both cases, however, the fluoridation affects the surface only on the nm scale which is in contrast to recent literature, where a penetration depth up to several microns was reported. Moreover, evidence is given that the actual fluoridation depth depends on the pH value. Recently, a qualitative three layer model was proposed for the fluoridation of HAp in an acidic agent. In addition to the elemental depth profile, as presented also by various other authors, we present a quantitative depth profile of the compounds CaF2, Ca(OH)2 and fluorapatite (FAp) that are predicted by the three layer model. The analysis of our experimental data exactly reproduces the structural order of the model, however, on a scale that differs by nearly two orders of magnitude from previous predictions. Our results also reveal that the amount of Ca(OH)2 and FAp is small as compared to that of CaF2. Therefore, it has to be questioned whether such narrow Ca(OH)2 and FAp layers really can act as protective layers for the enamel.
Author Soldera, Flavio
Mueller, Frank
Huefner, Stefan
Zeitz, Christian
Jacobs, Karin
Karl-Heinz Ehses
Mantz, Hubert
Hannig, Matthias
Author_xml – sequence: 1
  givenname: Frank
  surname: Mueller
  fullname: Mueller, Frank
– sequence: 2
  givenname: Christian
  surname: Zeitz
  fullname: Zeitz, Christian
– sequence: 3
  givenname: Hubert
  surname: Mantz
  fullname: Mantz, Hubert
– sequence: 4
  fullname: Karl-Heinz Ehses
– sequence: 5
  givenname: Flavio
  surname: Soldera
  fullname: Soldera, Flavio
– sequence: 6
  givenname: Matthias
  surname: Hannig
  fullname: Hannig, Matthias
– sequence: 7
  givenname: Stefan
  surname: Huefner
  fullname: Huefner, Stefan
– sequence: 8
  givenname: Karin
  surname: Jacobs
  fullname: Jacobs, Karin
BookMark eNqNjUsKwjAURYMoWD97eOC4EJOqdSwVF-BAcFBi-2orMS8mKZjdW8QFOLoHzoE7Y2NDBkcsEVKu0zwTYsqW3j8452K7E5uNTNi10PhEE5SGGm1owTpqOt2ZO1ADje7JdbUKWEMba0fvqKwKXUC4RbikTkWwLQVCjVVwZMDbL_iKbFywSaO0x-Vv52x1LM6HUzp8vHr0oXxQ78ygSsH3PJP5Lsvlf9UHr9hGVQ
ContentType Paper
Copyright 2008. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Copyright_xml – notice: 2008. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
DBID 8FE
8FG
ABJCF
ABUWG
AFKRA
AZQEC
BENPR
BGLVJ
CCPQU
DWQXO
HCIFZ
L6V
M7S
PIMPY
PQEST
PQQKQ
PQUKI
PRINS
PTHSS
DatabaseName ProQuest SciTech Collection
ProQuest Technology Collection
Materials Science & Engineering Collection
ProQuest Central (Alumni)
ProQuest Central
ProQuest Central Essentials
ProQuest Central
Technology Collection
ProQuest One Community College
ProQuest Central Korea
SciTech Premium Collection
ProQuest Engineering Collection
Engineering Database
Publicly Available Content Database
ProQuest One Academic Eastern Edition (DO NOT USE)
ProQuest One Academic
ProQuest One Academic UKI Edition
ProQuest Central China
Engineering Collection
DatabaseTitle Publicly Available Content Database
Engineering Database
Technology Collection
ProQuest Central Essentials
ProQuest One Academic Eastern Edition
ProQuest Central (Alumni Edition)
SciTech Premium Collection
ProQuest One Community College
ProQuest Technology Collection
ProQuest SciTech Collection
ProQuest Central China
ProQuest Central
ProQuest Engineering Collection
ProQuest One Academic UKI Edition
ProQuest Central Korea
Materials Science & Engineering Collection
ProQuest One Academic
Engineering Collection
DatabaseTitleList Publicly Available Content Database
Database_xml – sequence: 1
  dbid: 8FG
  name: ProQuest Technology Collection
  url: https://search.proquest.com/technologycollection1
  sourceTypes: Aggregation Database
DeliveryMethod fulltext_linktorsrc
Discipline Physics
EISSN 2331-8422
Genre Working Paper/Pre-Print
GroupedDBID 8FE
8FG
ABJCF
ABUWG
AFKRA
ALMA_UNASSIGNED_HOLDINGS
AZQEC
BENPR
BGLVJ
CCPQU
DWQXO
FRJ
HCIFZ
L6V
M7S
M~E
PIMPY
PQEST
PQQKQ
PQUKI
PRINS
PTHSS
ID FETCH-proquest_journals_20904387483
IEDL.DBID BENPR
IngestDate Thu Oct 10 20:24:15 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-proquest_journals_20904387483
OpenAccessLink https://www.proquest.com/docview/2090438748?pq-origsite=%requestingapplication%
PQID 2090438748
PQPubID 2050157
ParticipantIDs proquest_journals_2090438748
PublicationCentury 2000
PublicationDate 20080609
PublicationDateYYYYMMDD 2008-06-09
PublicationDate_xml – month: 06
  year: 2008
  text: 20080609
  day: 09
PublicationDecade 2000
PublicationPlace Ithaca
PublicationPlace_xml – name: Ithaca
PublicationTitle arXiv.org
PublicationYear 2008
Publisher Cornell University Library, arXiv.org
Publisher_xml – name: Cornell University Library, arXiv.org
SSID ssj0002672553
Score 2.705141
SecondaryResourceType preprint
Snippet Structural and chemical changes that arise from a fluoridation of synthetic hydroxyapatite in neutral and acidic fluoridation agents are investigated. For...
SourceID proquest
SourceType Aggregation Database
SubjectTerms Calcium fluoride
Chemical composition
Crystal structure
Depth profiling
Fluorapatite
Fluoridation
Hydroxyapatite
Mathematical models
Organic chemistry
Penetration depth
Photoelectrons
Predictions
Reagents
Slaked lime
Spectrum analysis
X ray photoelectron spectroscopy
Title Elemental depth profiling of fluoridated hydroxyapatite by X-ray photoelectron spectroscopy
URI https://www.proquest.com/docview/2090438748
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8QwEB7cFsGbT3ysS0CvgT6y3fQkKK2LsMsiCgUPS9sk9LDY2nYPvfjbnXRTPQh7DIG8CPPlm_kyA3CPCOypPJvS1HcVZSpgFGFEUDdjLk8zRIQ-A99iGczf2UsyTYzDrTGyysEm9oZalLn2kSNJD3XQasb4Q_VFddUoHV01JTRGYHvIFBwL7MdouXr99bJ4wQzfzP4_Q9ujR3wM9iqtZH0CB_LzFA570WXenMFHZLTbGyJk1RZkV0AbwYSUiqjNFufXhFyQohNabpJq-XMrSdaRhNZpR6qibMuhkg3pf03q7JRl1Z3DXRy9Pc3psKK1uTXN-m-P_gVYSP_lJRAn4LnKkdUoIVgmvTQUgcOZ7-VKSO6yKxjvG-l6f_cNHO0UEAF1wjFYbb2VtwizbTaBEY-fJ-ZEsbX4jn4AvPWKZA
link.rule.ids 783,787,12777,21400,33385,33756,43612,43817
linkProvider ProQuest
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV07T8MwED5BKwQbT_EoYAlWS3m4bjIxoIYAbcVQpEgMkeOHMlQkTdIh_x7bTWBA6mzJL1n3-e6-uw_gUSOwp3g2xsx3FSaKEqxhRGA3I27AMo0ItgPffEHjT_KWjJMu4FZ3tMreJlpDLQpuYuTaSQ9N0mpCgqdyjY1qlMmudhIa-zAkvsZqUykevfzGWDw60T9m_5-ZtdgRHcPwg5WyOoE9-X0KB5Zyyesz-Jp2zO0VErJscrSVz9ZQggqF1GqjVzfuuEB5KwzZhBnycyNR1qIEV6xFZV40Ra9jg2zNpOlNWZTtOTxE0-VzjPsdpd2bqdO_E_oXMNDOv7wE5NCAK659GiUEyaTHQkGdgPgeV0IGLrmC0a6ZrncP38NhvJzP0tnr4v0GjrZcCIqdcASDptrIWw24TXZnb_UHj1aJ2A
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Elemental+depth+profiling+of+fluoridated+hydroxyapatite+by+X-ray+photoelectron+spectroscopy&rft.jtitle=arXiv.org&rft.au=Mueller%2C+Frank&rft.au=Zeitz%2C+Christian&rft.au=Mantz%2C+Hubert&rft.au=Karl-Heinz+Ehses&rft.date=2008-06-09&rft.pub=Cornell+University+Library%2C+arXiv.org&rft.eissn=2331-8422