Mechanism of Carrier Transport in n-Type [beta]-FeSi2/Intrinsic Si/p-Type Si Heterojunctions

Preparation of n-type β-FeSi2/intrinsic Si/p-type Si heterojunctions was accomplished by facing-target direct-current sputtering (FTDCS) and measuring their current-voltage characteristic curves at low temperatures ranging from 300 K down to 50 K. A mechanism of carrier transport in the fabricated h...

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Bibliographic Details
Published inAdvanced materials research Vol. 1119; p. 189
Main Authors Promros, Nathaporn, Takahara, Motoki, Baba, Ryuji, Mostafa, Tarek M, Shaban, Mahmoud, Yoshitake, Tsuyoshi
Format Journal Article
LanguageEnglish
Published Zurich Trans Tech Publications Ltd 01.07.2015
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