Characterization of the Microstructure of an AlN-Mullite-Al^sub 2^O3 Ceramic Layer on WCu Composite Alloy for Microelectronic Application

• Published in: Journal of electronic materials Vol. 44; no. 11; p. 4154
• Main Authors: Zhu, Jiandong, An, Rong, Wang, Chunqing, Zhang, Wei, Wen, Guangwu
• Format: Journal Article
• Language: English
• Published: Warrendale Springer Nature B.V 01.11.2015
• Subjects: Alloys; Ceramics; Materials science; Microstructure; Substrates
• ISSN: 0361-5235; 1543-186X
• DOI: 10.1007/s11664-015-3961-8

An AlN composite ceramic layer was designed and fabricated on WCu substrates by hydrolysis-assisted solidification and firing. First, the surface of WCu substrates were pre-coated with polycarbosilane/AlN ceramic layers by spinning; the layers were then fabricated by firing. The phase composition, microstructure, and element distribution of the ceramic layer and interfacial reaction layer were investigated by use of scanning electron microscopy, energy-dispersive spectroscopy and x-ray diffraction. The results showed that the ceramic layers were composed of AlN, mullite, and Al^sub 2^O3. There were many nanocrystalline rods on the surface of the ceramic layers. The Cr layer prevented the WCu substrate from reacting with water vapor during firing, and the Ni layer prevented diffusion of tungsten into the Cr layer. Study of the cross section of the ceramic layer fired on the Cr/Ni/WCu substrate revealed a perfect interfacial reaction layer.