Extraction of elastic-plastic material properties of thin films through nanoindentaion technique with support of numerical methods : THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICRO-ELECTRONICS AND MICRO-SYSTEMS (EUROSIME 2010)

Saved in:
Bibliographic Details
Published inMicroelectronics and reliability Vol. 51; no. 6; pp. 1046 - 1053
Main Authors DOWHAN, Łukasz, WYMYSŁOWSKI, Artur, JANUS, Paweł, EKWINSKA, Magdalena, WITTLER, Olaf
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier 2011
Subjects
Online AccessGet full text

Cover

Loading…
Author JANUS, Paweł
EKWINSKA, Magdalena
DOWHAN, Łukasz
WITTLER, Olaf
WYMYSŁOWSKI, Artur
Author_xml – sequence: 1
  givenname: Łukasz
  surname: DOWHAN
  fullname: DOWHAN, Łukasz
  organization: Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wroclaw, Poland
– sequence: 2
  givenname: Artur
  surname: WYMYSŁOWSKI
  fullname: WYMYSŁOWSKI, Artur
  organization: Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wroclaw, Poland
– sequence: 3
  givenname: Paweł
  surname: JANUS
  fullname: JANUS, Paweł
  organization: Institute of Electron Technology, Warsaw, Poland
– sequence: 4
  givenname: Magdalena
  surname: EKWINSKA
  fullname: EKWINSKA, Magdalena
  organization: Institute of Electron Technology, Warsaw, Poland
– sequence: 5
  givenname: Olaf
  surname: WITTLER
  fullname: WITTLER, Olaf
  organization: Fraunhofer Institute IZM, Micro Materials Center, Berlin, Germany
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=24195517$$DView record in Pascal Francis
BookMark eNqNjl1LwzAUhosouKn_4dwIChaSulnnXamRBvox2g62qxG61EbapCYp6n_3wnb6A7x6z8dzHs7cOZVK8hNnhh99z10t8PbUmSHkPbiejxfnztyYN4SQjzCeOd_k02pWWaEkqBp4y4wVldv_JnTMci1YC71WPddWcDNhthESatF2Ziy1Gl4bkEwqIQ9cWja5LK8aKd4HDh_CNmCGvlfaTrdy6EZlNTo7bht1MPAEZUTyJIjvICFhFKQ0DGII0mdINnFJ3XW0K2hYQEHHPihplh6XZLsmOU1IWhZAU0homGcuiUlY5lk68UfDcVrsipIkBdyQTZ6NGgIewuj20jmrWWv41V9eONcvpAwjt2dmfLDWTFbC7HstOqa_9t4Cr5ZL7N__l_sBUNd5hw
CODEN MCRLAS
ContentType Journal Article
Copyright 2015 INIST-CNRS
Copyright_xml – notice: 2015 INIST-CNRS
DBID IQODW
DatabaseName Pascal-Francis
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Applied Sciences
EISSN 1872-941X
EndPage 1053
ExternalDocumentID 24195517
GroupedDBID --K
--M
.DC
.~1
08R
0R~
123
1B1
1~.
1~5
29M
4.4
457
4G.
5VS
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAPBV
AAQFI
AAQXK
AAXUO
ABBOA
ABFNM
ABFRF
ABMAC
ABPIF
ABPTK
ABXDB
ABXRA
ABYKQ
ACDAQ
ACGFS
ACNNM
ACRLP
ACZNC
ADBBV
ADEZE
ADJOM
ADMUD
ADTZH
AEBSH
AECPX
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AHJVU
AHZHX
AIALX
AIEXJ
AIKHN
AITUG
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
AOUOD
AXJTR
AZFZN
BJAXD
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
GBLVA
GBOLZ
HZ~
IHE
IQODW
J1W
JJJVA
KOM
LY7
M41
MAGPM
MO0
N9A
O-L
O9-
OAUVE
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
RXW
SDF
SDG
SES
SET
SEW
SPC
SPCBC
SPD
SSM
SST
SSV
SSZ
T5K
T9H
TAE
UHS
UNMZH
WUQ
XOL
ZMT
~G-
ID FETCH-pascalfrancis_primary_241955173
ISSN 0026-2714
IngestDate Sun Oct 22 16:08:43 EDT 2023
IsPeerReviewed true
IsScholarly true
Issue 6
Keywords Nanoindentation
Mechanical properties
Numerical method
Microelectronics
Algorithm
Optimization
Thin film
Finite element method
Plastic material
Test method
Properties of materials
Measurement method
Plastics
Language English
License CC BY 4.0
LinkModel OpenURL
MergedId FETCHMERGED-pascalfrancis_primary_241955173
ParticipantIDs pascalfrancis_primary_24195517
PublicationCentury 2000
PublicationDate 2011
PublicationDateYYYYMMDD 2011-01-01
PublicationDate_xml – year: 2011
  text: 2011
PublicationDecade 2010
PublicationPlace Kidlington
PublicationPlace_xml – name: Kidlington
PublicationTitle Microelectronics and reliability
PublicationYear 2011
Publisher Elsevier
Publisher_xml – name: Elsevier
SSID ssj0007011
Score 3.8973043
SourceID pascalfrancis
SourceType Index Database
StartPage 1046
SubjectTerms Applied sciences
Electronics
Exact sciences and technology
Materials
Title Extraction of elastic-plastic material properties of thin films through nanoindentaion technique with support of numerical methods : THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICRO-ELECTRONICS AND MICRO-SYSTEMS (EUROSIME 2010)
Volume 51
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3dj9JAEN-c96QPfpwaPy_zIIkGS2hpKfhGejWtQLnQEuDp0kJR4lkILdHcg3-5D87sbj-4M34lpMB2mWyYXzqzs7-ZYexVq0tJB8ZS6YSGruixqird0DSUdrSI26a-UFe82cTQazsT_cPMmB3dqlVYS_ssaiyufplX8j9axTHUK2XJ_oNmC6E4gJ9Rv3hFDeP1r3Rsf8t2stc3-nwxOsI4RdmK9zr6onwRxMHaEn1a1JfNPq0TKsf0JS2a9CRhsqGyiUkWkqyyrqsksG_JSReUD3HAcyk7T6c8ohA49njYG_DYqm05PU8UjPTO6sPJIHCVc2fuu5Zf9138Ltr80E17do67SGomQGnMdcTDeKTYA9sKxiOP5nMJfNSf-4HNQw4doh6iILtOB-x5HCNvSUXswrKxjyg_vYsv16IYeXF6cDaa4ippvTXLQF96_zlMrwrzNB_OfTE-mvp9lz89d2iZC7JRz5v4wvv-GvOJBUPb7k9dz-_3RBbURyJri-7keWBFLUMqea5P1W5obUUzRbprIxamomNqSlfnDX8KWyKL565vGAY6Sq84GejVtkoLnLMOrhnmgi6JXlYXPVuqmaDjQxif2o3vJZHJbKqiL6RcI9F7wxShsBKtWSr-UnCf3ZUbHegJ1D5gR3Fywu7JTQ9Ik5KesDuVipgP2Y8S0rBZwTVIQw5pKCFN0wjSwCENEtJwCGkoIA0EaZCQpt8WkAYJaXgHEtBvoYQzIBjhAM5QwpnfrMAZXA9uwFlIqMIZXudgBgLzm0es9t4OLEc5-GMvtqIgzEWun9ZjdpxskvgJA2IchFFzaS6XTQqhRKbWWmpaNwwjfdGK9Kfs9Peynv1pwnN2W5xv0OsFO852-_glOshZdMrx8RORu7ye
link.rule.ids 315,783,787,4031
linkProvider Elsevier
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Extraction+of+elastic-plastic+material+properties+of+thin+films+through+nanoindentaion+technique+with+support+of+numerical+methods+%3A+THERMAL%2C+MECHANICAL+AND+MULTI-PHYSICS+SIMULATION+AND+EXPERIMENTS+IN+MICRO-ELECTRONICS+AND+MICRO-SYSTEMS+%28EUROSIME+2010%29&rft.jtitle=Microelectronics+and+reliability&rft.au=DOWHAN%2C+%C5%81ukasz&rft.au=WYMYS%C5%81OWSKI%2C+Artur&rft.au=JANUS%2C+Pawe%C5%82&rft.au=EKWINSKA%2C+Magdalena&rft.date=2011&rft.pub=Elsevier&rft.issn=0026-2714&rft.eissn=1872-941X&rft.volume=51&rft.issue=6&rft.spage=1046&rft.epage=1053&rft.externalDBID=n%2Fa&rft.externalDocID=24195517
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0026-2714&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0026-2714&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0026-2714&client=summon