Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents : Semiconductor Surfaces and Interfaces in Materials Science

• Published in: Physica status solidi. B. Basic research Vol. 248; no. 2; pp. 370 - 374
• Main Authors: WIELGOSZEWSKI, Grzegorz, SULECKI, Przemysław, GOTSZALK, Teodor, JANUS, Paweł, GRABIEC, Piotr, HECKER, Michael, RITZ, Yvonne, ZSCHECH, Ehrenfried
• Format: Journal Article
• Language: English
• Published: Berlin Wiley-VCH 2011
• Subjects: Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Physics; Thermal instruments, apparatus and techniques; Thermal properties; Micromachining; Measuring methods; Thermal conductivity; Nanotechnology; Scanning thermal microscopy