CdTe/ZnTe : critical thickness and coherent heterosctructures
Saved in:
| Published in | Superlattices and microstructures Vol. 9; no. 2; pp. 271 - 274 |
|---|---|
| Main Authors | , , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Oxford
Elsevier
1991
|
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Author | FEUILLET, G NAHMANI, A DESHAYES, C SAMINADAYAR, K LE SI DANG MALLARD, R TATARENKO, S CIBERT, J ANDRE, R JOUNEAU, P. H |
|---|---|
| Author_xml | – sequence: 1 givenname: J surname: CIBERT fullname: CIBERT, J organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 2 givenname: R surname: ANDRE fullname: ANDRE, R organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 3 givenname: C surname: DESHAYES fullname: DESHAYES, C organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 4 givenname: G surname: FEUILLET fullname: FEUILLET, G organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 5 givenname: P. H surname: JOUNEAU fullname: JOUNEAU, P. H organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 6 surname: LE SI DANG fullname: LE SI DANG organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 7 givenname: R surname: MALLARD fullname: MALLARD, R organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 8 givenname: A surname: NAHMANI fullname: NAHMANI, A organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 9 givenname: K surname: SAMINADAYAR fullname: SAMINADAYAR, K organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France – sequence: 10 givenname: S surname: TATARENKO fullname: TATARENKO, S organization: CNRS Univ. Joseph Fourier, lab. spectrométrie physique, Saint-Martin-Hères 38402, France |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19577007$$DView record in Pascal Francis |
| BookMark | eNqNzL0KwjAUQOEgFaw_75DFsXhLa0IEp6L4AJ1cSkhvabSm5d508O118AGczvJx1iIJY8CFSHMwKiuU1olIQZcmU1ColVgzPwDAlLlOxblqazzcQ43yJB356J0dZOy9ewZklja00o09EoYoe4xII7tIs4szIW_FsrMD4-7XjdhfL3V1yybL309HNjjPzUT-Zend5OaoNYAu_nUft-I9Lw |
| CODEN | SUMIEK |
| ContentType | Journal Article |
| Copyright | 1991 INIST-CNRS |
| Copyright_xml | – notice: 1991 INIST-CNRS |
| DBID | IQODW |
| DatabaseName | Pascal-Francis |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Chemistry Physics |
| EISSN | 1096-3677 |
| EndPage | 274 |
| ExternalDocumentID | 19577007 |
| GroupedDBID | --K --M -~X .~1 0R~ 123 1B1 1RT 1~. 1~5 29Q 4.4 457 4G. 5VS 7-5 71M 8P~ 9JN AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABMAC ABNEU ABPIF ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFS ACNNM ACRLP ADBBV ADEZE ADFGL ADMUD AEBSH AEKER AENEX AEZYN AFKWA AFTJW AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BBWZM BKOJK BLXMC CAG COF CS3 DM4 DU5 EBS EFBJH EJD EO8 EO9 EP2 EP3 FDB FEDTE FGOYB FIRID FNPLU FYGXN G-2 G-Q GBLVA HMV HZ~ IHE IQODW J1W KOM LG5 M24 M37 MAGPM MO0 N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SMS SPC SPCBC SPD SPG SSM SSQ SSZ T5K UHS WUQ XPP ZMT ZU3 ~G- |
| ID | FETCH-pascalfrancis_primary_195770073 |
| ISSN | 0749-6036 |
| IngestDate | Sun Oct 29 17:07:44 EDT 2023 |
| IsPeerReviewed | false |
| IsScholarly | false |
| Issue | 2 |
| Keywords | Cadmium Tellurides Quantum well Exciton Semiconductor materials Transition metal Compounds Photoluminescence Cadmium Zinc Tellurides Mixed Experimental study Solid solution Inorganic compound Continuum Thickness Energy gap Reflection high energy electron diffraction Preparation Piezoelectricity Chemical composition Optical modulation Optical reflection |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-pascalfrancis_primary_195770073 |
| ParticipantIDs | pascalfrancis_primary_19577007 |
| PublicationCentury | 1900 |
| PublicationDate | 1991 |
| PublicationDateYYYYMMDD | 1991-01-01 |
| PublicationDate_xml | – year: 1991 text: 1991 |
| PublicationDecade | 1990 |
| PublicationPlace | Oxford |
| PublicationPlace_xml | – name: Oxford |
| PublicationTitle | Superlattices and microstructures |
| PublicationYear | 1991 |
| Publisher | Elsevier |
| Publisher_xml | – name: Elsevier |
| SSID | ssj0009417 |
| Score | 2.4980955 |
| SourceID | pascalfrancis |
| SourceType | Index Database |
| StartPage | 271 |
| SubjectTerms | Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics |
| Title | CdTe/ZnTe : critical thickness and coherent heterosctructures |
| Volume | 9 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bT8IwFG4MxuiLUdR4JXvQx-lYu435NmEIgjzAiOgLoV0J0TiIwxd_vb3tpsZbsjRL0y7dvuW0Pf3OdwA4deGkSiiXQnTsUEcWhjquWaFuohp1MKHEmPIT3due3Rqim5E1yhJdiuiSJT4nb1_GlfwHVVbHcOVRsn9ANn0oq2D3DF9WMoRZ-SuM62FAWe-HKKBia0-SvAWcxP4kjJgMW5tRIcI049yXeUyEZuzri6IPPiYxIQvu21tyNpzs98zJenGxMT-uaF_5_aBwpOT1Gn2_QD9s-IOWd-8PCo7Ypj9sd7u-6Hud-Rs4Lypzf6m5OmehHOTqtgGVlrW0oGxPpENb5WZRJtbN_Ulm3lzK9Ctq5jVlvp6iKPaHySqlEFZdy3GkjgAXCCqBVa_Tv-tkgstIZFtOh8hJr5OYQTCVCUtyq4hgC2yq5b_mSSy3wQqNymC9nmTdK4M1Qckl8Q4Q6F5wbLVLLUFWS5HVGEJagqz2CdldcNb0g3pLLwxnvJDiIuPkveAeKEXziO4DzTKJjSYUTlxIUAhdjIlBIKVGiCxoTPEBqHz_rMOfGhyBDUmB49cxKLHB0hO22Friivqu7xSbNYA |
| link.rule.ids | 315,786,790,4043 |
| linkProvider | Library Specific Holdings |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=CdTe%2FZnTe+%3A+critical+thickness+and+coherent+heterosctructures&rft.jtitle=Superlattices+and+microstructures&rft.au=CIBERT%2C+J&rft.au=ANDRE%2C+R&rft.au=DESHAYES%2C+C&rft.au=FEUILLET%2C+G&rft.date=1991&rft.pub=Elsevier&rft.issn=0749-6036&rft.eissn=1096-3677&rft.volume=9&rft.issue=2&rft.spage=271&rft.epage=274&rft.externalDBID=n%2Fa&rft.externalDocID=19577007 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0749-6036&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0749-6036&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0749-6036&client=summon |