Fluorescence EXAFS analysis of local structures around Cr atoms in (Ga,Cr)As
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| Published in | Physica. B, Condensed matter Vol. 376-77; pp. 651 - 653 |
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| Main Authors | , , , , , , , |
| Format | Conference Proceeding |
| Language | English |
| Published |
Amsterdam
Elsevier
2006
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| Subjects | |
| Online Access | Get full text |
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| Author | OFUCHI, H AKINAGA, H MIZUGUCHI, M ONO, K OKABAYASHI, J OSHIMA, M YAMADA, M TAKEDA, Y |
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| Author_xml | – sequence: 1 givenname: H surname: OFUCHI fullname: OFUCHI, H organization: Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan – sequence: 2 givenname: M surname: YAMADA fullname: YAMADA, M organization: Department of Applied Chemistry, University of Tokyo, Tokyo 113-8656, Japan – sequence: 3 givenname: J surname: OKABAYASHI fullname: OKABAYASHI, J organization: Department of Applied Chemistry, University of Tokyo, Tokyo 113-8656, Japan – sequence: 4 givenname: M surname: MIZUGUCHI fullname: MIZUGUCHI, M organization: Department of Applied Chemistry, University of Tokyo, Tokyo 113-8656, Japan – sequence: 5 givenname: K surname: ONO fullname: ONO, K organization: Institute of Materials Structure Science, KEK, Tsukuba 305-0801, Japan – sequence: 6 givenname: Y surname: TAKEDA fullname: TAKEDA, Y organization: Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan – sequence: 7 givenname: M surname: OSHIMA fullname: OSHIMA, M organization: Department of Applied Chemistry, University of Tokyo, Tokyo 113-8656, Japan – sequence: 8 givenname: H surname: AKINAGA fullname: AKINAGA, H organization: SYNAF-NRI-AIST, Tsukuba Central 4, 1-1-1 Higashi, Tsukuba 305-8562, Japan |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17685467$$DView record in Pascal Francis |
| BookMark | eNqNjMsKgkAUQIcwSKt_uJugIMHx3VJEa9GuFu3kMo1gjDMyVxf-fS76gM7mbA7HY442Wq6Yy_Ms8kMeJQ5zg0vI_TgJ0w3ziD7BAs-4y-61moyVJKQWEqpXUT8ANaqZOgLTgjICFdBoJzFOSwdozaTfUFrA0fQEnYbjFc-lPRW0Y-sWFcn9z1t2qKtnefMHpGXTWtSio2awXY92bniW5kmcZtG_3Rc_ykE9 |
| ContentType | Conference Proceeding |
| Copyright | 2006 INIST-CNRS |
| Copyright_xml | – notice: 2006 INIST-CNRS |
| DBID | IQODW |
| DatabaseName | Pascal-Francis |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Physics |
| EISSN | 1873-2135 |
| EndPage | 653 |
| ExternalDocumentID | 17685467 |
| GroupedDBID | --K --M -~X .~1 08R 0R~ 123 1B1 1RT 1~. 1~5 29O 4.4 457 4G. 5VS 6TJ 7-5 71M 8P~ 9JN AABNK AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABMAC ABNEU ABPIF ABPTK ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFS ACNCT ACNNM ACRLP ADBBV ADEZE ADIYS ADMUD AEBSH AEKER AFFNX AFKWA AFTJW AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BBWZM BKOJK BLXMC CS3 EBS EFJIC EJD EO8 EO9 EP2 EP3 FDB FEDTE FGOYB FIRID FNPLU FYGXN G-Q GBLVA HMV HZ~ H~9 IHE IQODW J1W K-O KOM M38 M41 MAGPM MO0 MVM N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SPC SPCBC SPD SPG SSQ SSZ T5K TN5 VOH WUQ XJT XOL XPP YNT ZMT ~02 ~G- |
| ID | FETCH-pascalfrancis_primary_176854673 |
| ISSN | 0921-4526 |
| IngestDate | Sun Oct 22 16:07:49 EDT 2023 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Keywords | Impurity distribution Gallium arsenides 61.72.Vv (Ga,Cr)As Fluorescence 75.50.Pp X-ray diffraction Chromium additions XRD EXAFS Bond lengths Semimagnetic semiconductors 61.10.Ht Local structure Impurity site |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | OpenURL |
| MeetingName | Proceedings of the 23rd international conference on defects in semiconductors, ICDS-23, Awaji Island, Japan, 27-29 July 2005 |
| MergedId | FETCHMERGED-pascalfrancis_primary_176854673 |
| ParticipantIDs | pascalfrancis_primary_17685467 |
| PublicationCentury | 2000 |
| PublicationDate | 2006 |
| PublicationDateYYYYMMDD | 2006-01-01 |
| PublicationDate_xml | – year: 2006 text: 2006 |
| PublicationDecade | 2000 |
| PublicationPlace | Amsterdam |
| PublicationPlace_xml | – name: Amsterdam |
| PublicationTitle | Physica. B, Condensed matter |
| PublicationYear | 2006 |
| Publisher | Elsevier |
| Publisher_xml | – name: Elsevier |
| SSID | ssj0000171 |
| Score | 3.2626157 |
| SourceID | pascalfrancis |
| SourceType | Index Database |
| StartPage | 651 |
| SubjectTerms | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals; microstructure Doping and impurity implantation in iii-v and ii-vi semiconductors Exact sciences and technology Magnetic properties and materials Magnetic semiconductors Physics Structure of solids and liquids; crystallography Studies of specific magnetic materials |
| Title | Fluorescence EXAFS analysis of local structures around Cr atoms in (Ga,Cr)As |
| Volume | 376-77 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LT8JAEN4gxkRPihjxQfagiaaWsC2l9FgqL0UhARLwQlpoExNpTQsXD_52Z3f7QglGL0272Tbtftl5deYbhK5qVAk684poEbssUo8B9tysLGoOccBgtyhnFs22eK62R5WHsTLOZLqprKXV0irNPjbWlfwHVRgDXGmV7B-QjR8KA3AO-MIREIbjT4w3qpo-X-aSUGcRT4_2sw3AhlyYyzjvNmxT9LbyfMbdBDu5MdabA8FMEZIwnSZwNtkVzBNMnzZcEgxfALd8wbJmaUSB2poGoKzpsTHea46Mdmet0GECovxeXwu29h71uj7RB3xmEp3uvIxa0f1PW2MQUXFMOroogWuqSCHLNZetNVUWJcLZSSLhC_JNDPu4cAlaDfln7fBKThRV9HP-m_6KswoJuE4KCP4dtCvJmkJlXOmTpMjEmPsdvxpNgzUDWFyHtzBJ2RXDQ5RPKi5xPwb4CGVsN4cOUmSRObTHsQ6OUTeNJWZY4ghL7DmYYYkTLDHHEhs-ZljiVxfftMw7w7_Vgzy6bjaGRltce8vpO2chmUZfK5-grOu59inChMgmmNOSRhS1Ys8VyyzbSs2iiUGqOpOlAipuf9bZbxPO0X6C_wXKwpfYl2CVLa0iW-wvS5o7uA |
| link.rule.ids | 310,311,786,790,795,796,4069,4070,23958,23959,25170 |
| linkProvider | Elsevier |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Physica.+B%2C+Condensed+matter&rft.atitle=Fluorescence+EXAFS+analysis+of+local+structures+around+Cr+atoms+in+%28Ga%2CCr%29As&rft.au=OFUCHI%2C+H&rft.au=YAMADA%2C+M&rft.au=OKABAYASHI%2C+J&rft.au=MIZUGUCHI%2C+M&rft.date=2006-01-01&rft.pub=Elsevier&rft.issn=0921-4526&rft.eissn=1873-2135&rft.volume=376-77&rft.spage=651&rft.epage=653&rft.externalDBID=n%2Fa&rft.externalDocID=17685467 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0921-4526&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0921-4526&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0921-4526&client=summon |