Quantitative thin-layer chromatography/mass spectrometry analysis of caffeine using a surface sampling probe electrospray lonization tandem mass spectrometry system

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Published inAnalytical chemistry (Washington) Vol. 77; no. 14; pp. 4385 - 4389
Main Authors FORD, Michael J, DEIBEL, Michael A, TOMKINS, Bruce A, VAN BERKEL, Gary J
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 2005
Subjects
Analytical chemistry
Chemistry
Chromatographic methods and physical methods associated with chromatography
Exact sciences and technology
Other chromatographic methods
Spectrometric and optical methods
Deuterium
Performance evaluation
Chemical analysis
Internal standard
HPLC chromatography
Electrospray
Chemical ionization
Thin layer chromatography
Reversed phase chromatography
Ultraviolet detector
Detection limit
Mass spectrometry MS/MS
Standard curve
Soft drink
Sampling
Mass spectrometry
Monitoring
Quantitative analysis
Caffeine
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Author DEIBEL, Michael A
TOMKINS, Bruce A
VAN BERKEL, Gary J
FORD, Michael J
Author_xml – sequence: 1
  givenname: Michael J
  surname: FORD
  fullname: FORD, Michael J
  organization: Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
– sequence: 2
  givenname: Michael A
  surname: DEIBEL
  fullname: DEIBEL, Michael A
  organization: Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
– sequence: 3
  givenname: Bruce A
  surname: TOMKINS
  fullname: TOMKINS, Bruce A
  organization: Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
– sequence: 4
  givenname: Gary J
  surname: VAN BERKEL
  fullname: VAN BERKEL, Gary J
  organization: Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16974093$$DView record in Pascal Francis
BookMark eNqNjUFKBDEQRYOMYI96h9q4bEy6tWdmLYpbwf1Qxsp0JKmEVFqI5_GgjuLOjasPj897a7XixHSiOnM76H7aboeV6rTWYz9stD5Ta5E3rY3RZurU59OCXH3F6t8J6uy5D9iogJ1LiljToWCe23VEEZBMth4x1dIAGUMTL5AcWHSOPBMs4vkACLIUh5ZAMObwjXJJLwQUfgSSCzYIif3HsZsYKvIrRfgbkSaV4oU6dRiELn_3XF093D_fPfYZxWJwBdl62efiI5a2N9Nuc6N34_jf3xeU42ZE
CODEN ANCHAM
ContentType Journal Article
Copyright 2005 INIST-CNRS
Copyright_xml – notice: 2005 INIST-CNRS
DBID IQODW
DatabaseName Pascal-Francis
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Chemistry
EISSN 1520-6882
EndPage 4389
ExternalDocumentID 16974093
GroupedDBID ---
-DZ
-~X
.DC
.GJ
.HR
.K2
08R
186
1WB
23M
2KS
3EH
3O-
4.4
53G
55A
5GY
5RE
5VS
6J9
6TJ
7~N
85S
AABXI
AAUTI
ABDEX
ABFRP
ABHFT
ABHMW
ABMVS
ABOCM
ABPPZ
ABPTK
ABQRX
ABUCX
ACBEA
ACGFO
ACGFS
ACGOD
ACIWK
ACJ
ACKIV
ACKOT
ACNCT
ACPRK
ACPVT
ACQAM
ACS
ADHLV
AEESW
AENEX
AETEA
AFDAS
AFEFF
AFFDN
AFFNX
AFRAH
AGXLV
AHGAQ
AIDAL
ALMA_UNASSIGNED_HOLDINGS
ANTXH
AQSVZ
BAANH
BKOMP
CS3
D0L
EBS
ED~
EJD
F5P
G8K
GGK
GNL
IH9
IHE
IQODW
JG~
KZ1
LG6
LMP
MVM
NHB
OHT
OMK
P2P
PQQKQ
RNS
ROL
RXW
TAE
TAF
TN5
UBC
UBX
UHB
UI2
UKR
VF5
VG9
VOH
VQA
W1F
WH7
X6Y
XFK
XOL
XSW
YQI
YQJ
YXE
YYP
YZZ
ZCA
ZCG
ZE2
ZGI
~02
ID FETCH-pascalfrancis_primary_169740933
ISSN 0003-2700
IngestDate Sun Oct 29 17:08:11 EDT 2023
IsPeerReviewed true
IsScholarly true
Issue 14
Keywords Deuterium
Performance evaluation
Chemical analysis
Internal standard
HPLC chromatography
Electrospray
Chemical ionization
Thin layer chromatography
Reversed phase chromatography
Ultraviolet detector
Detection limit
Mass spectrometry MS/MS
Standard curve
Soft drink
Sampling
Mass spectrometry
Monitoring
Quantitative analysis
Caffeine
Language English
License CC BY 4.0
LinkModel OpenURL
MergedId FETCHMERGED-pascalfrancis_primary_169740933
ParticipantIDs pascalfrancis_primary_16974093
PublicationCentury 2000
PublicationDate 2005
PublicationDateYYYYMMDD 2005-01-01
PublicationDate_xml – year: 2005
  text: 2005
PublicationDecade 2000
PublicationPlace Washington, DC
PublicationPlace_xml – name: Washington, DC
PublicationTitle Analytical chemistry (Washington)
PublicationYear 2005
Publisher American Chemical Society
Publisher_xml – name: American Chemical Society
SSID ssj0011016
Score 3.597453
SourceID pascalfrancis
SourceType Index Database
StartPage 4385
SubjectTerms Analytical chemistry
Chemistry
Chromatographic methods and physical methods associated with chromatography
Exact sciences and technology
Other chromatographic methods
Spectrometric and optical methods
Title Quantitative thin-layer chromatography/mass spectrometry analysis of caffeine using a surface sampling probe electrospray lonization tandem mass spectrometry system
Volume 77
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Nb9NAEF1FvQAHVAqIj1LNgZ6sgF1vjX1M05TS0iIgoN6qtb2rIrVO5dgH-D38ov6izuyHvaYIKBcrspO1nXkez86-ecPYyyQrI64yOc4zfNx4pgQ-c1yNeRkqlZa5iHQV_9Fxsv-FH5xsn4xGVx5rqW3yV8WP39aV_I9VcR_alapkb2HZblDcgZ_RvrhFC-P2n2z8sRWVLhIj-k9z9q0anwsMoYPirF5gJGrVqHH8CwyRA11USeoETU2iS70YSSGUkhRttjpxIIJlWytB2rOC-Oa6XJ04GbZlzvKyFt-D84Ur4QwoGyEvgpsnMTLRfvyrNVBM-rxwreYoyO16OlVeaoImqB61v1_B2p2925m99w91OJx_OKKERAfb_sjXyXGwM_t0aH74VrMFBzmP7R6fbhmrk1Ow5NaBj4-pys6s9kjr1mmSnKYDv2_bx1h8c8-L89i0EbIRATWI71-XjiLwy1u04zZGCU7RwowEaHkYk-udTD93C1uULHFNHOkiiYsrlngjyvRR8YKb-Sq7b2clMDEQe8BGslpjd6bOQmvsnqdb-ZD99IEHPfBgCLzXhAjwEQEOdrBQ4GAHGnYgwMIOHOxAww582EEPOzCwg5snMbB7xDb3ZvPp_nhw56eXRl7l1P2B8WO2Ui0q-YRBWiR5LItSRRnnaVaIMkq2QrFVSvEmC1P-lG38eaxnf_vCc3ZXi_Lq5No6W2nqVr7AcLPJN7QBrwF7rZhb
link.rule.ids 315,783,787,4033
linkProvider American Chemical Society
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Quantitative+thin-layer+chromatography%2Fmass+spectrometry+analysis+of+caffeine+using+a+surface+sampling+probe+electrospray+lonization+tandem+mass+spectrometry+system&rft.jtitle=Analytical+chemistry+%28Washington%29&rft.au=FORD%2C+Michael+J&rft.au=DEIBEL%2C+Michael+A&rft.au=TOMKINS%2C+Bruce+A&rft.au=VAN+BERKEL%2C+Gary+J&rft.date=2005&rft.pub=American+Chemical+Society&rft.issn=0003-2700&rft.eissn=1520-6882&rft.volume=77&rft.issue=14&rft.spage=4385&rft.epage=4389&rft.externalDBID=n%2Fa&rft.externalDocID=16974093
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0003-2700&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0003-2700&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0003-2700&client=summon