In situ imaging of paste extrusion using electrical impedance tomography Process tomography
Saved in:
| Published in | Measurement science & technology Vol. 13; no. 12; pp. 1890 - 1897 |
|---|---|
| Main Authors | , , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Bristol
Institute of Physics
2002
|
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Author | VAUHKONEN, Marko SCOTT, David M SUNSHINE, Gregg KOSTUCH, Jacek SCHLABERG, H. Inaki WILLIAMS, Richard A WEST, Robert M RUOZHOU HOU HEIKKINEN, Lasse HOYLE, Brian S |
|---|---|
| Author_xml | – sequence: 1 givenname: Robert M surname: WEST fullname: WEST, Robert M organization: Centre for Particle and Colloid Engineering, School of Process, Environmental and Materials Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom – sequence: 2 givenname: David M surname: SCOTT fullname: SCOTT, David M organization: DuPont Central Research and Development, Experimental Station, Building E304, Wilmington, Delaware 19880-0304, United States – sequence: 3 givenname: Gregg surname: SUNSHINE fullname: SUNSHINE, Gregg organization: DuPont Central Research and Development, Experimental Station, Building E304, Wilmington, Delaware 19880-0304, United States – sequence: 4 givenname: Jacek surname: KOSTUCH fullname: KOSTUCH, Jacek organization: Imerys, John Keay House, St Austell, Cornwall PL25 4DJ, United Kingdom – sequence: 5 givenname: Lasse surname: HEIKKINEN fullname: HEIKKINEN, Lasse organization: Department of Applied Physics, University of Kuopio, PO Box 1627, 70211 Kuopio, Finland – sequence: 6 givenname: Marko surname: VAUHKONEN fullname: VAUHKONEN, Marko organization: Department of Applied Physics, University of Kuopio, PO Box 1627, 70211 Kuopio, Finland – sequence: 7 givenname: Brian S surname: HOYLE fullname: HOYLE, Brian S organization: Institute of Integrated Information Systems, School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom – sequence: 8 givenname: H. Inaki surname: SCHLABERG fullname: SCHLABERG, H. Inaki organization: Institute of Integrated Information Systems, School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom – sequence: 9 surname: RUOZHOU HOU fullname: RUOZHOU HOU organization: Centre for Particle and Colloid Engineering, School of Process, Environmental and Materials Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom – sequence: 10 givenname: Richard A surname: WILLIAMS fullname: WILLIAMS, Richard A organization: Centre for Particle and Colloid Engineering, School of Process, Environmental and Materials Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14369348$$DView record in Pascal Francis |
| BookMark | eNqNjb8OgjAYxL8YTAT1Hbo4krSWP3Y2GtzdSQMfWANt05ZE3t4OPoDL3XC_u8sg0UbjBlLGK5ZXJWUJpFSUdU7PnO8g8_5NKa2pECk0D028CgtRsxyVHokZiJU-IMFPcItXRpOoMcAJu-BUJ6fIWuyl7pAEM5vRSftaD7Ad5OTx-PM9nO6357XJ41rsDC7yyrfWxSO3tqzgleDFhf_LfQH6UUG7 |
| ContentType | Journal Article |
| Copyright | 2003 INIST-CNRS |
| Copyright_xml | – notice: 2003 INIST-CNRS |
| DBID | IQODW |
| DatabaseName | Pascal-Francis |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Sciences (General) Physics |
| EISSN | 1361-6501 |
| EndPage | 1897 |
| ExternalDocumentID | 14369348 |
| GroupedDBID | -DZ -~X .DC .GJ 02O 1JI 1PV 1WK 29M 4.4 5B3 5GY 5PX 5VS 5ZH 5ZI 69O 6TJ 6TU 7.M 7.Q 9BW AAGCD AAGCF AAGID AAHTB AAJIO AAJKP AALHV AAPBV AATNI ABCXL ABHWH ABPEJ ABQJV ABTAH ABVAM ACAFW ACGFO ACGFS ACHIP AEFHF AENEX AFFNX AFYNE AHGVY AHSEE AKPSB ALMA_UNASSIGNED_HOLDINGS ASPBG ATQHT AVWKF AZFZN BBWZM CBCFC CEBXE CJUJL CRLBU CS3 DU5 EBS EDWGO EJD EMSAF EPQRW EQZZN F20 F5P FEDTE HAK HVGLF H~9 IHE IJHAN IOP IQODW IZVLO JCGBZ KC5 KNG KOT LAP M45 MVM N5L N9A NT- NT. OHT P2P PJBAE Q02 R4D RIN RKQ RNS RO9 ROL RPA RW3 S3P SY9 T37 TAE TN5 TWZ W28 WH7 XFK XPP YQT ZCG ZMT ZY4 ~02 |
| ID | FETCH-pascalfrancis_primary_143693483 |
| ISSN | 0957-0233 |
| IngestDate | Tue Sep 20 22:37:03 EDT 2022 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 12 |
| Keywords | Electrode impedance Voltage measurement Rheology Paste Measuring methods Plastic deformation Experimental study Strain sensors Electrical measurement Imaging Tomography Extrusion Multielectrode device |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-pascalfrancis_primary_143693483 |
| ParticipantIDs | pascalfrancis_primary_14369348 |
| PublicationCentury | 2000 |
| PublicationDate | 2002 |
| PublicationDateYYYYMMDD | 2002-01-01 |
| PublicationDate_xml | – year: 2002 text: 2002 |
| PublicationDecade | 2000 |
| PublicationPlace | Bristol |
| PublicationPlace_xml | – name: Bristol |
| PublicationTitle | Measurement science & technology |
| PublicationYear | 2002 |
| Publisher | Institute of Physics |
| Publisher_xml | – name: Institute of Physics |
| SSID | ssj0007099 |
| Score | 3.3374896 |
| SourceID | pascalfrancis |
| SourceType | Index Database |
| StartPage | 1890 |
| SubjectTerms | Computers in experimental physics Electrical and electronic components, instruments and techniques Exact sciences and technology General equipment and techniques Image processing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing |
| Subtitle | Process tomography |
| Title | In situ imaging of paste extrusion using electrical impedance tomography |
| Volume | 13 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1JS8NAFB6kIHgRWxXXMgcFJUSaTJLJHKVUUsFWsAVvJctEemhabHrx1_tmyabidgnJEEIm38ebl2_egtBFSHniszQ0XcJj0_ESakaJ55nMY5FPueXEUsp-GHnB1Ll_dmsb7TK7JI9u4rcv80r-gyqMAa4iS_YPyJYPhQE4B3zhCAjD8VcYDzNjPc83xnyhew2lxioE2AywuK8boYMZG6kFqGY3Eo85-MmJzBPIl4t6veqirVMlGhpFzo-gR_5Zgx88Targ7FpjYiETlPHytfHpSIhjgyI15qU09mPwS_uBCtqNdfXgQomo_lgbcQ0ycjVuKo3UBNdA2TGu7CzxLBOcQ6thiEmdcHbNrFq-6imql2i4pNX6VezZf1jWymBD8Ag9RhyREO70iEzyHD-WqzXtMV2PUb2kCI4N14BHqhqb1LyNyR7a1b8J-FZh3kZbPOugbT3pDmprk7zGV7pu-PU-CoYZFnTAmg54mWJJB1zSAUs64IoOuKQDruhwgC7vBpN-YDZecbZShUlmxUzJIWply4wfIRxyTuxeZDM_ZU5KUj-1I5LEbkhiymjiHqPu9886-emGU7QjO-RIWeoMtWBC_BwctTzqyi_9DoXhS4A |
| link.rule.ids | 315,783,787,4033 |
| linkProvider | IOP Publishing |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=In+situ+imaging+of+paste+extrusion+using+electrical+impedance+tomography&rft.jtitle=Measurement+science+%26+technology&rft.au=WEST%2C+Robert+M&rft.au=SCOTT%2C+David+M&rft.au=SUNSHINE%2C+Gregg&rft.au=KOSTUCH%2C+Jacek&rft.date=2002&rft.pub=Institute+of+Physics&rft.issn=0957-0233&rft.eissn=1361-6501&rft.volume=13&rft.issue=12&rft.spage=1890&rft.epage=1897&rft.externalDBID=n%2Fa&rft.externalDocID=14369348 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0957-0233&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0957-0233&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0957-0233&client=summon |