APA (7th ed.) Citation

Brubaker, M. D., Roshko, A., Berweger, S., Blanchard, P. T., Little, C. A. E., Harvey, T. E., . . . Bertness, K. A. (2020). Crystallographic polarity measurements in two-terminal GaN nanowire devices by lateral piezoresponse force microscopy∗ ∗Contribution of an agency of the U.S. government; not subject to copyright. Nanotechnology, 31(42), . https://doi.org/10.1088/1361-6528/ab9fb2

Chicago Style (17th ed.) Citation

Brubaker, Matt D., Alexana Roshko, Samuel Berweger, Paul T. Blanchard, Charles A E. Little, Todd E. Harvey, Norman A. Sanford, and Kris A. Bertness. "Crystallographic Polarity Measurements in Two-terminal GaN Nanowire Devices by Lateral Piezoresponse Force Microscopy∗ ∗Contribution of an Agency of the U.S. Government; Not Subject to Copyright." Nanotechnology 31, no. 42 (2020). https://doi.org/10.1088/1361-6528/ab9fb2.

MLA (9th ed.) Citation

Brubaker, Matt D., et al. "Crystallographic Polarity Measurements in Two-terminal GaN Nanowire Devices by Lateral Piezoresponse Force Microscopy∗ ∗Contribution of an Agency of the U.S. Government; Not Subject to Copyright." Nanotechnology, vol. 31, no. 42, 2020, https://doi.org/10.1088/1361-6528/ab9fb2.