A Charge-Based Analytical Threshold Voltage Definition Applicable to Cryogenic Temperatures

• Published in: 2021 Silicon Nanoelectronics Workshop (SNW) pp. 1 - 2
• Main Authors: Takeuchi, Kiyoshi, Mizutani, Tomoko, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, Toshiro
• Format: Conference Proceeding
• Language: English
• Published: JSAP 13.06.2021
• Subjects: Bending; Conferences; Cryogenics; Nanoelectronics; Silicon; Temperature distribution; Threshold voltage

A threshold voltage (V_{TH}) definition based on 2\psi_{B} band bending is widely accepted. However, it is not directly related with electrically determined V_{TH} , and is not appropriate in a near zero absolute temperature range. In this work, an alternative simple analytical definition of V_{TH}...