Giant near-field optical enhancement with subnanometer tip-sample distance sensitivity

Summary form only given. In a recent paper, A.V. Bragas et al. (1998) have shown a giant optical field enhancement (more than 1000) at the tip-sample junction of a scanning tunneling microscope. The magnitude of the field enhancement obtained is larger than expected from abundant calculation perform...

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Published inQuantum Electronics and Laser Science Conference (QELS 2000). Technical Digest. Postconference Edition. TOPS Vol.40 (IEEE Cat. No.00CH37089) pp. 61 - 62
Main Authors Martinez, O.E., Bragas, A.V., Lester, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2000
Subjects
Apertures
Dielectric materials
Gold
Large Hadron Collider
Optical imaging
Optical sensors
Optical surface waves
Optimized production technology
Pattern analysis
Tunneling
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Summary:Summary form only given. In a recent paper, A.V. Bragas et al. (1998) have shown a giant optical field enhancement (more than 1000) at the tip-sample junction of a scanning tunneling microscope. The magnitude of the field enhancement obtained is larger than expected from abundant calculation performed for different tip-sample geometries. In this work it is shown that when the metallic tip is approached to a sample to subnanometer distances, and it is shone with light, the field enhancement at the tip is increased by a resonant mechanism, yielding light scattering signals extremely sensitive to the tip-sample distance. Experimental results indicate subnanometer sensitivity, and a model is given consistent with the results.
ISBN:1557526087
9781557526083
ISSN:1094-5695