VTH Instability of -GaN Gate HEMTs Under Static and Dynamic Gate Stress
The impacts of static and dynamic gate stress on the threshold voltage (<inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula>) instability in Schottky-type <inline-formula> <tex-math notation="LaTeX">{p} <...
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Published in | IEEE electron device letters Vol. 39; no. 10; pp. 1576 - 1579 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
IEEE
01.10.2018
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Abstract | The impacts of static and dynamic gate stress on the threshold voltage (<inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula>) instability in Schottky-type <inline-formula> <tex-math notation="LaTeX">{p} </tex-math></inline-formula>-GaN gate AlGaN/GaN heterojunction field-effect transistors are experimentally investigated. <inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula> shifts negatively under large positive bias static stress (<inline-formula> <tex-math notation="LaTeX">{V}_{\text {G}}\_ {\text {stress}} > 5 </tex-math></inline-formula> V) by adopting conventional quasi-static characterization techniques. In contrast, <inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula> under fast-dynamic-stress exhibits positive shift, and a positive frequency dependence occurs within a wide range of frequency from 10 Hz to 1 MHz. The different <inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula> instability behavior under static and dynamic stress mainly originates from the time-dependent charges (electrons and holes) storage/release mechanisms in the <inline-formula> <tex-math notation="LaTeX">{p} </tex-math></inline-formula>-GaN layer, which is floating in the Schottky-type <inline-formula> <tex-math notation="LaTeX">{p} </tex-math></inline-formula>-GaN gate HEMT. |
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AbstractList | The impacts of static and dynamic gate stress on the threshold voltage (<inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula>) instability in Schottky-type <inline-formula> <tex-math notation="LaTeX">{p} </tex-math></inline-formula>-GaN gate AlGaN/GaN heterojunction field-effect transistors are experimentally investigated. <inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula> shifts negatively under large positive bias static stress (<inline-formula> <tex-math notation="LaTeX">{V}_{\text {G}}\_ {\text {stress}} > 5 </tex-math></inline-formula> V) by adopting conventional quasi-static characterization techniques. In contrast, <inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula> under fast-dynamic-stress exhibits positive shift, and a positive frequency dependence occurs within a wide range of frequency from 10 Hz to 1 MHz. The different <inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}} </tex-math></inline-formula> instability behavior under static and dynamic stress mainly originates from the time-dependent charges (electrons and holes) storage/release mechanisms in the <inline-formula> <tex-math notation="LaTeX">{p} </tex-math></inline-formula>-GaN layer, which is floating in the Schottky-type <inline-formula> <tex-math notation="LaTeX">{p} </tex-math></inline-formula>-GaN gate HEMT. |
Author | Chen, Kevin J. Tang, Gaofei He, Jiabei |
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Snippet | The impacts of static and dynamic gate stress on the threshold voltage (<inline-formula> <tex-math notation="LaTeX">{V}_{\text {TH}}... |
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Title | VTH Instability of -GaN Gate HEMTs Under Static and Dynamic Gate Stress |
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